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pro vyhledávání: '"J. S. Hovis"'
Autor:
J. S. Hovis, C. H. Becker
Publikováno v:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 12:2352-2356
Photoionization at high laser intensities (∼1014 W/cm2) has been used to examine gaseous and sputtered atoms and molecules together with reflecting time‐of‐flight mass spectrometry. Light from a 35‐ps Nd:YAG laser pulse was focused with a 10
Publikováno v:
IARC scientific publications. (19)