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pro vyhledávání: '"J. R. Einhorn"'
Autor:
J. R. Einhorn, Sean R. Agnew, Nathan Peterson, Jeffrey R. Bunn, E. A. Payzant, Chris M. Fancher
Publikováno v:
Journal of Applied Crystallography. 54:867-877
Strategies for efficient and reliable texture measurements have been explored using the Nanoscale Ordered Materials Diffractometer (NOMAD) at the Spallation Neutron Source located at Oak Ridge National Laboratory (ORNL). To test these strategies, the
Publikováno v:
Journal of Applied Crystallography. 50:859-865
The texture of recrystallized straight-rolled α-uranium foils, a component in prospective irradiation target designs for medical isotope production, has been measured by neutron diffraction, as well as X-ray diffraction using both Cu and Mo sources.
Publikováno v:
Journal of Applied Crystallography. 50:851-858
This study reports an angular diffraction peak shift that scales linearly with the neutron beam path length traveled through a diffracting sample. This shift was observed in the context of mapping the residual stress state of a large U–8 wt% Mo cas