Zobrazeno 1 - 10
of 183
pro vyhledávání: '"J. Perlich"'
Publikováno v:
Biomedical physics & engineering express 6(3), 035012 (2020). doi:10.1088/2057-1976/ab7cad
Biomedical physics & engineering express 6(3), 035012 (2020). doi:10.1088/2057-1976/ab7cad
SAXS-CT is an emerging powerful imaging technique which bridges the gap between information retrieved from high-resolution local techniques and informatio
SAXS-CT is an emerging powerful imaging technique which bridges the gap between information retrieved from high-resolution local techniques and informatio
Publikováno v:
Macromolecules. 41:2186-2194
Two different uniform thicknesses (8 and 68 nm) of a nanocomposite film comprising diblock copolymer matrix and magnetic nanoparticles filler have been installed in one sample preparation step under identical condition simultaneously. Long-range inte
Autor:
Leander Schulz, Ya-Jun Cheng, Mine Memesa, S. V. Roth, M. M. Abu Kashem, J. Perlich, Jochen S. Gutmann, Peter Müller-Buschbaum
Publikováno v:
Langmuir. 23:10299-10306
For the controlled modification of sol-gel-templated polymer nanocomposites, which are transferred to a nanostructured, crystalline TiO2 phase by a calcination process, the addition of a single homopolymer was investigated. For the preparation, the h
Autor:
J. Perlich, Matti Knaapila, Swapna Pradhan, Ullrich Scherf, Beverly Stewart, Sofia M. Fonseca, Mika Torkkeli, Ricardo A. E. Castro, Hugh D. Burrows
Publikováno v:
Soft matter. 10(17)
We report on the conjugated polyelectrolyte 12 mM poly[9,9-bis(4-sulfonylbutoxyphenyl) fluorene-2,7-diyl-2,2′-bithiophene] (PBS-PF2T) mixed in concentrated aqueous 680 mM tetraethylene glycol monododecyl ether (C12E4) in bulk and thin films. A blue
Akademický článek
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Autor:
Alexander Weber, M. Reiners, Mikko Ritala, See‐Hun Yang, Thomas Schäpers, Y. Yamashita, C. H. Chen, C. M. Schneider, S. Ueda, Larissa Juschkin, Igor Nemeth, Sergey Seriy, Kilian Flöhr, H. D. Yang, L. Juschkin, M. Leskelä, Rainer Jany, Alexander X. Gray, H. Boschker, Claus M. Schneider, R. Muenstermann, Susanne Hoffmann-Eifert, I. Krug, Markku Leskelä, Dieter Weber, W. Drube, U. Klemradt, Alexander Kaiser, J. Niinistö, C.S Fadley, J. Perlich, M. H. Lee, H. Mähne, Regina Dittmann, Anke Aretz, Jochen Mannhart, Meiken Falke, Jan Minár, Manfred Martin, Lukasz Plucinski, H. Kim, Irina Kärkkänen, F. Pfaff, Jürgen Braun, L. Plucinski, Jaakko Niinistö, S. Stille, H. Yusuf Günel, A. X. Gray, S. Hoffmann‐Eifert, M.‐W. Chu, A. Köhl, Guus Rijnders, K. Sladek, Eli Rotenberg, Ch. Lenser, Markus Morgenstern, Mark Huijben, M. Sing, H. Ebert, T. Blanquart, David H.A. Blank, T. Mikolajick, Alexandra Steffen, G. Berner, R. Waser, Aleksey Maryasov, Stefan Mattauch, P. Loosen, Charles S. Fadley, Stefan Herbert, Tobias Salge, Jun-ichiro Kishine, Aaron Bostwick, Tassilo Heeg, Tadachika Nakayama, Yoshihiko Togawa, A. Müller, Róza Võfély, Haifeng Li, Mikko Heikkilä, Thomas Brückel, K. Kobayashi, Sabine Pütter, Gertjan Koster, J. Braun, Markus Waschk, N. Aslam, Slavomír Nemšák, Rainer Lebert, Rainer Waser, K. Bergmann, Carsten Woltmann, Yuehua Chen, Igor Proskurin, Koichi Niihara, Hans Boschker, W. Stein, Milias Crumbach, G. Conti, Dave H. A. Blank, Marcus Liebmann, Robert Frielinghaus, S. Danylyuk, R. Claessen, Ulrich Poppe, Susanne Stemmer, Hilde Hardtdegen, A. S. Ovchinnikov, S. Thiess, Roman Nowak, Christoph Richter, J. Minar, Juergen Braun, Hubert Ebert
Publikováno v:
Frontiers in Electronic Materials: A Collection of Extended Abstracts of the Nature Conference Frontiers in Electronic Materials, June 17 to 20 2012, Aachen, Germany
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7f4859ca45a32c3c016bfc011e9fd804
https://doi.org/10.1002/9783527667703.ch70
https://doi.org/10.1002/9783527667703.ch70
Publikováno v:
Faraday Discussions. 158:77
Casein micelles undergo shape changes when subjected to frontal filtration forces. Grazing incidence small angle X-ray scattering (GISAXS) and atomic force microscopy (AFM) allow a quantification of such structural changes on filtration cakes deposit
Publikováno v:
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 22:3059
The applicability of scatterometry for mask critical dimension (CD) metrology at extreme ultraviolet (EUV) wavelengths is investigated. Two different mask absorber stacks, a Cr∕SiO2 mask and a TaN∕Cr mask are patterned with periodic lines and spa
Akademický článek
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Autor:
D. R. Rueda, J. J. HernaÌndez, M. C. GarciÌa-GutieÌrrez, T. A. Ezquerra, M. Soccio, N. Lotti, A. Munari, J. Perlich, R. Serna
Publikováno v:
Langmuir; Nov2010, Vol. 26 Issue 22, p17540-17545, 6p