Zobrazeno 1 - 10
of 123
pro vyhledávání: '"J. Pekarik"'
Autor:
U. S. Raghunathan, S. Sirohi, V. Ruparelia, P. K. Sharma, D. P. Ioannou, V. Jain, H. K. Kakara, S. Gedela, V. Vanukuru, P. Dongmo, C. Luce, R. Hazbun, R. Krishnasamy, J. Hwang, M. Levy, K. Welch, S. Liu, B. Cucci, S. Cole, J. Kantarovsky, A. Vallett, I. McCallum-Cook, M. Yu, R. Phelps, A. Divergilio, A. Sturm, M. Peters, S. Johnson, R. Rassel, M. Lagerquist, M. Kerbaugh, K. Newton, J. Pekarik, Q. Liu
Publikováno v:
2022 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::67ea73f38d4a6964790419c9125cf1c6
https://doi.org/10.1109/bcicts53451.2022.10051761
https://doi.org/10.1109/bcicts53451.2022.10051761
Autor:
Jeffrey B. Johnson, Dongmo Pernell, Uppili S. Raghunathan, Rajendran Krishnasamy, Henry Lee Aldridge, John J. Pekarik, Vibhor Jain, Mishra Rahul
Publikováno v:
ECS Transactions. 98:127-134
Process sensitivity and variation, such as layer thicknesses, etch dimensions and doping levels are all process parameters that should be well understood when assessing their impact on end of process wafer quality and device performance. Improvements
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::23961cb163669d249dec381d3652ad3b
https://doi.org/10.1149/09805.0127ecst
https://doi.org/10.1149/09805.0127ecst
Autor:
Dimitris P. Ioannou, Uppili S. Raghunathan, Dave Brochu, Adam Divergilio, Vibhor Jain, John J. Pekarik
Publikováno v:
2021 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0e1505a14d5128361d7dbc6d238ade82
https://doi.org/10.1109/bcicts50416.2021.9682453
https://doi.org/10.1109/bcicts50416.2021.9682453
Autor:
Renata Camillo-Castillo, John J. Pekarik, Vibhor Jain, James W. Adkisson, Qizhi Liu, David L. Harame, Alvin J. Joseph
Publikováno v:
ECS Transactions. 75:103-111
Advanced BiCMOS technology is a cost-effective candidate for wide-range of applications, including Radar (automotive radars, high-speed industrial sensors), high-speed wireless and wireline communication, high-speed instrumentation, and mmWave THz im
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::771e8b86cc4b78832d418d423738191f
https://doi.org/10.1149/07508.0103ecst
https://doi.org/10.1149/07508.0103ecst
Autor:
Andrew J. Pekarik, Gary Shank
Publikováno v:
Curator: The Museum Journal. 58:435-439
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::19659dea6b67692d4f48a985dcecc76f
https://doi.org/10.1111/cura.12139
https://doi.org/10.1111/cura.12139
Autor:
Zahava D. Doering, Andrew J. Pekarik
Publikováno v:
Transforming Practice ISBN: 9781315416496
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::02f2a9d95fd02126a3cbc181ea0c8f9f
https://doi.org/10.4324/9781315416496-33
https://doi.org/10.4324/9781315416496-33
Autor:
Andrew J. Pekarik, James B. Schreiber
Publikováno v:
Curator: The Museum Journal. 57:45-59
This paper discusses the benefits of using Latent Class Analysis (LCA) versus K-means Cluster Analysis or Hierarchical Clustering as a way to understand differences among visitors in museums, and is part of a larger research program directed toward i
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c56d84140db0f79d93b36bbb65693e6b
https://doi.org/10.1111/cura.12050
https://doi.org/10.1111/cura.12050
Publikováno v:
The Journal of Educational Research. 106:462-468
The authors examine a model of visitor engagement that has been in development over the past 3 years at the Smithsonian Institution. A total of 390 visitors comprised the sample with a subsample (n = 102) of visitors who were tracked through an exhib
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f71d34eaa60a648952e198a8d96e0fa0
https://doi.org/10.1080/00220671.2013.833011
https://doi.org/10.1080/00220671.2013.833011
Autor:
James B. Schreiber, Andrew J. Pekarik
Publikováno v:
Curator: The Museum Journal. 55:487-496
In 1999, the first author and his colleagues at the Smithsonian Institution published an article in Curator: The Museum Journal introducing research on the experiences visitors find satisfying in museums. Subsequent data collection has expanded on th
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::44f144ce9df53181fc66fc4a085376ae
https://doi.org/10.1111/j.2151-6952.2012.00171.x
https://doi.org/10.1111/j.2151-6952.2012.00171.x
Autor:
Andrew J. Pekarik
Publikováno v:
Curator: The Museum Journal. 54:75-78
Probably as far back as we humans go, we have been dependent on cultural continuity. Essential parts of culture exist on multiple levels: individual, family, community, region, nation, and so on. It’s the sharing of critical elements across these l
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2523b18190f23fed25b1ebd0b68a10ff
https://doi.org/10.1111/j.2151-6952.2010.00069.x
https://doi.org/10.1111/j.2151-6952.2010.00069.x