Zobrazeno 1 - 10
of 11
pro vyhledávání: '"J. P. R. Poitevin"'
Autor:
M. R. E. Bichara, J. P. R. Poitevin
Publikováno v:
IEEE Transactions on Instrumentation and Measurement. :323-328
The aim of this work is to measure nondestructively the resistivity of a semiconductor in the form of an epitaxial layer. The method involves the measurements of the attenuation suffered by an electromagnetic wave reflected by a semiconducting surfac
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::22e2ce65e5dd8c7b8d0af387b381dea0
https://doi.org/10.1109/tim.1964.4313421
https://doi.org/10.1109/tim.1964.4313421
Autor:
Löschner, H., Kranzer, D.
Publikováno v:
Journal of Applied Physics; Aug1973, Vol. 44 Issue 8, p3663-3668, 6p
Autor:
Arapov, Yu., Davydov, A.
Publikováno v:
Measurement Techniques; Aug1977, Vol. 20 Issue 8, p1214-1218, 5p
Publikováno v:
IEEE Transactions on Communications; 1974, Vol. 22 Issue 9, p1226-1235, 10p
Autor:
Srivastava, G. P., Jain, A. K.
Publikováno v:
Review of Scientific Instruments; Dec1971, Vol. 42 Issue 12, p1793-1796, 4p
Publikováno v:
IEEE Transactions on Instrumentation & Measurement; 1969, Vol. 18 Issue 2, p110-113, 4p
Publikováno v:
IEEE Spectrum; 1965, Vol. 2 Issue 4, p150-168, 19p
Autor:
Edrich, J., Hardee, P.C.
Publikováno v:
IEEE Transactions on Microwave Theory & Techniques; 1976, Vol. 24 Issue 5, p273-275, 3p
Publikováno v:
IEEE Transactions on Instrumentation & Measurement; 1964, Vol. 13 Issue 4, p364a-5, 0p