Zobrazeno 1 - 7
of 7
pro vyhledávání: '"J. P. Nadai"'
Autor:
S. Fourtine, J.-M. Palau, C. Vial, O. Bersillon, M.-C. Calvet, J. Gasiot, J. P. Nadai, D. Roth
Publikováno v:
RADECS 97. Fourth European Conference on Radiation and its Effects on Components and Systems (Cat. No.97TH8294).
Comparison between HETC and COSMIC codes shows that COSMIC code, although being a protons-silicon interaction code, can be used to calculate the energy deposited by high energy neutrons in silicon.
Publikováno v:
physica status solidi (b). 109:417-422
Two typical absorption bands of Eu-rich EuO, located around 0.56 and 0.67 eV are studied in the temperature range 20 to 270 K. The results and previous data cannot be explained satisfactorily by the two models reported in the literature: i) excitatio
Publikováno v:
Nuclear Instruments and Methods in Physics Research. 197:1-13
A general analytical theory of depth profiling using narrow resonances is outlined. It is shown how some basic features of the stochastic theory of fast ion slowing down in disordered matter may be turned to advantage for a rigorous calculation of yi
Publikováno v:
Journal of Physics and Chemistry of Solids. 30:2117-2134
We have studied the influence of the electrolyte on the composition of dielectric films formed by anodic polarisation of tantalum. The electrolytes used were mainly aqueous solutions of salts and acids (H 2 SO 4 , H 3 PO 4 , HNO 3 etc.) at various co
Publikováno v:
Collection of Czechoslovak Chemical Communications. 36:883-889
Autor:
B. Agius, S. Rigo, C. Ortega, B. Maurel, D. Dieumegard, G. Velasco, G. Amsel, J. Siejka, M. Croset, J. P. Nadai
Publikováno v:
Journal of Radioanalytical Chemistry. 12:377-378
The direct observation of nuclear reactions, or o f Rutherford backscattering, induced by charged particles is particularly suitable for the study of surface phenomena. The use of these techniques in various fields like the study of anodic oxidation,
Publikováno v:
Journal of The Electrochemical Society. 118:717
The anodic oxidation of silicon and tantalum in organic solvents containing small quantities of dissolved salts and water has been studied. The source of oxygen in the oxide layer has been determined using O18‐labeled materials. The isotopic exchan