Zobrazeno 1 - 3
of 3
pro vyhledávání: '"J. P. Hoogenboom"'
Autor:
S. R. Hemelaar, P. de Boer, M. Chipaux, W. Zuidema, T. Hamoh, F. Perona Martinez, A. Nagl, J. P. Hoogenboom, B. N. G. Giepmans, R. Schirhagl
Publikováno v:
Scientific Reports, Vol 7, Iss 1, Pp 1-9 (2017)
Abstract Nanodiamonds containing fluorescent nitrogen-vacancy centers are increasingly attracting interest for use as a probe in biological microscopy. This interest stems from (i) strong resistance to photobleaching allowing prolonged fluorescence o
Externí odkaz:
https://doaj.org/article/fccea65d2dba4bac96f91e43f8dce320
Publikováno v:
Structural Dynamics, Vol 6, Iss 2, Pp 024102-024102-11 (2019)
Crucial for the field of ultrafast electron microscopy is the creation of sub-picosecond, high brightness electron pulses. The use of a blanker to chop the beam that originates from a high brightness Schottky source may provide an attractive alternat
Externí odkaz:
https://doaj.org/article/530ae0b40e5748e78ef791ff1b595d21
Autor:
A C, Zonnevylle, R F C, Van Tol, N, Liv, A C, Narvaez, A P J, Effting, P, Kruit, J P, Hoogenboom
Publikováno v:
Journal of microscopy. 252(1)
We present an integrated light-electron microscope in which an inverted high-NA objective lens is positioned inside a scanning electron microscope (SEM). The SEM objective lens and the light objective lens have a common axis and focal plane, allowing