Zobrazeno 1 - 10
of 16
pro vyhledávání: '"J. Périnet"'
Autor:
V. Hortelano, Juan Fernando Masa Jiménez, J. Périnet, Jorge Souto, François J. Laruelle, Julian Anaya
Publikováno v:
Microelectronics Reliability. 53:1501-1505
Degradation of high power laser diodes is related to defect formation in the active parts of the laser. Extended defects can develop both at the facets, and inside the cavity. Their characterization is necessary for understanding the mechanisms drivi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1c7cd0fd4f943cd2f453d5a5d7337148
https://doi.org/10.1016/j.microrel.2013.07.071
https://doi.org/10.1016/j.microrel.2013.07.071
Publikováno v:
Nuclear Engineering and Design
Nuclear Engineering and Design, 2004, 232 (3), pp.219-236. ⟨10.1016/j.nucengdes.2004.05.005⟩
Nuclear Engineering and Design, Elsevier, 2004, 232 (3), pp.219-236. ⟨10.1016/j.nucengdes.2004.05.005⟩
Nuclear Engineering and Design, 2004, 232 (3), pp.219-236. ⟨10.1016/j.nucengdes.2004.05.005⟩
Nuclear Engineering and Design, Elsevier, 2004, 232 (3), pp.219-236. ⟨10.1016/j.nucengdes.2004.05.005⟩
In the past, a lot of experimental studies have been devoted to creep-fatigue interactions in austenitic stainless steels. Tests have been carried mainly at temperatures of at least 600 °C and at high applied strains, which are supposed to be the mo
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::94852c0d6ffa5f3c379c22441fc936fb
https://doi.org/10.1016/j.nucengdes.2004.05.005
https://doi.org/10.1016/j.nucengdes.2004.05.005
Publikováno v:
Microelectronics Reliability. 43:1761-1766
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::20a8355902c4f4c6b8e6c62a7f3c390a
https://doi.org/10.1016/s0026-2714(03)00295-6
https://doi.org/10.1016/s0026-2714(03)00295-6
Publikováno v:
Microelectronics Reliability. 42:1307-1310
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7e3bfa6792b2b33c798c236ee47fe2b9
https://doi.org/10.1016/s0026-2714(02)00140-3
https://doi.org/10.1016/s0026-2714(02)00140-3
Publikováno v:
Microelectronics Reliability. 40:1701-1708
The development of optical communications has generated a huge expansion of the use of optoelectronic components for transmission, mainly for transmitters, receivers and optical amplifiers. This development has been possible because the technology is
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::92da680debb479cc1997a458b301da3e
https://doi.org/10.1016/s0026-2714(00)00162-1
https://doi.org/10.1016/s0026-2714(00)00162-1
Publikováno v:
Microelectronics Reliability. 43:1767-1769
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::083fdfeaefd142baedf0aefe38b8f5d4
https://doi.org/10.1016/s0026-2714(03)00297-x
https://doi.org/10.1016/s0026-2714(03)00297-x
Publikováno v:
52nd Electronic Components and Technology Conference 2002. (Cat. No.02CH37345).
Qualification of opto-electronic devices is a mandatory but complex activity to perform in a fast changing technical environment and under a strong market pressure. In this paper, we analyze the advantages and drawbacks of the traditional qualificati
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4e2d71c51ab9ab8cd1892965a19176b0
https://doi.org/10.1109/ectc.2002.1008149
https://doi.org/10.1109/ectc.2002.1008149
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