Zobrazeno 1 - 10
of 47
pro vyhledávání: '"J. Nathawat"'
Autor:
C.-P. Kwan, M. Street, A. Mahmood, W. Echtenkamp, M. Randle, K. He, J. Nathawat, N. Arabchigavkani, B. Barut, S. Yin, R. Dixit, U. Singisetti, Ch. Binek, J. P. Bird
Publikováno v:
AIP Advances, Vol 9, Iss 5, Pp 055018-055018-7 (2019)
We study temperature dependent (200 – 400 K) dielectric current leakage in high-quality, epitaxial chromia films, synthesized on various conductive substrates (Pd, Pt and V2O3). We find that trap-assisted space-charge limited conduction is the domi
Externí odkaz:
https://doaj.org/article/d1b44cc515bb4324b8fc1a539f176f62
Autor:
G. He, Jonas Fransson, H. Ramamoorthy, J. Nathawat, N. Arabchigavkani, Minzhi Zhao, C-P Kwan, B. Barut, Jonathan P. Bird, Zhiwen Jin, R. Somphonsane, S. Yin
Publikováno v:
Scientific Reports, Vol 10, Iss 1, Pp 1-13 (2020)
Scientific Reports
Scientific Reports
The differential conductance of graphene is shown to exhibit a zero-bias anomaly at low temperatures, arising from a suppression of the quantum corrections due to weak localization and electron interactions. A simple rescaling of these data, free of
Autor:
B. Barut, J.G. Gluschke, Jonathan P. Bird, Michael Randle, N. Arabchigavkani, J. Nathawat, R. Dixit, Keke He, Adam P. Micolich, C.-P. Kwan, S. Yin
Publikováno v:
ACS Applied Electronic Materials. 1:2260-2267
We fabricated graphene field-effect transistors (GFETs) with hybrid organic/inorganic gate dielectrics, in which parylene C is used as the organic component. The HOMO–LUMO gap of parylene is large ...
Autor:
H. Ramamoorthy, Jonathan P. Bird, G. He, Michio Kida, Gil-Ho Kim, C.-P. Kwan, Kohei Sakanashi, Naoki Matsumoto, R. Somphonsane, Miao Zhao, Yunseob Kim, Nobuyuki Aoki, Takashi Taniguchi, S. Yin, Zhi Jin, Kenji Watanabe, J. Nathawat, N. Arabchigavkani, Michael Randle
Publikováno v:
ACS Omega, Vol 4, Iss 2, Pp 4082-4090 (2019)
ACS Omega
ACS Omega
We use transient electrical measurements to investigate the details of self-heating and charge trapping in graphene transistors encapsulated in hexagonal boron nitride (h-BN) and operated under strongly nonequilibrium conditions. Relative to more sta
Autor:
R. Dixit, Maria C. Asensio, Jonathan P. Bird, Takeshi Komesu, B. Barut, C.-P. Kwan, N. Arabchigavkani, Michael Randle, Alexey Lipatov, Peter A. Dowben, Avinash Kumar, S. Yin, José Avila, Uttam Singisetti, Keke He, Alexander Sinitskii, J. Nathawat
Publikováno v:
ACS Nano. 13:803-811
We explore the electrical characteristics of TiS3 nanowire field-effect transistor (FETs), over the wide temperature range from 3 to 350 K. These nanomaterials have a quasi-one-dimensional (1D) crystal structure and exhibit a gate-controlled metal-in
Autor:
Keke He, Michael Randle, Tetsuya D. Mishima, C.-P. Kwan, Ian R. Sellers, David K. Ferry, N. Arabchigavkani, B. Barut, J. Nathawat, M. B. Santos, S. Yin, Jonathan P. Bird, R. Dixit
Publikováno v:
Physical Review Materials. 4
Autor:
B. Barut, Nobuyuki Aoki, Peter A. Dowben, H. Ramamoorthy, G. He, N. Arabchigavkani, R. Somphonsane, Jonathan P. Bird, Michael Randle, R. Dixit, J. Nathawat, S. Yin, Kohei Sakanashi, Wai-Ning Mei, Keke He, Jonas Fransson, Kechun Zhang, Liu-Jun Wang
Publikováno v:
Physical review letters. 126(8)
Mesoscopic conductance fluctuations are a ubiquitous signature of phase-coherent transport in small conductors, exhibiting universal character independent of system details. In this Letter, however, we demonstrate a pronounced breakdown of this unive
Autor:
R. Dixit, Eric Pop, B. Barut, Christopher D. English, J. Nathawat, Michael Randle, Keke He, N. Arabchigavkani, Kirby K. H. Smithe, S. Yin, Jonathan P. Bird
Publikováno v:
Physical Review Materials. 4
Drift velocity saturation (at some characteristic value, ${v}_{d}^{\mathrm{sat}}$) is a critical process that limits the ultimate current-carrying capacity of semiconductors at high electric fields $(\ensuremath{\sim}{10}^{4}\phantom{\rule{0.16em}{0e
Akademický článek
Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
K zobrazení výsledku je třeba se přihlásit.
K zobrazení výsledku je třeba se přihlásit.
Autor:
Kohei Sakanashi, Nobuyuki Aoki, R. Somphonsane, Jonathan P. Bird, J. Nathawat, H. Ramamoorthy
Publikováno v:
Extended Abstracts of the 2019 International Conference on Solid State Devices and Materials.