Zobrazeno 1 - 2
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pro vyhledávání: '"J. N. Gaspar-Angeles"'
Publikováno v:
IEEE Journal of the Electron Devices Society, Vol 9, Pp 464-468 (2021)
The Analytical Full Capacitance Model (AFCM) for amorphous oxide semiconductors thin film transistors (AOSTFTs) is first validated, using a 19-stages Ring Oscillator (RO) fabricated and measured. The model was described in Verilog-A language to use i
Externí odkaz:
https://doaj.org/article/6ed8c638eb434057bc8691b14827a39f
Autor:
J. N. Gaspar-Angeles, Magali Estrada, Antonio Cerdeira, Y. Hernandez-Barrios, Benjamin Iniguez
Publikováno v:
2020 IEEE Latin America Electron Devices Conference (LAEDC).
A full capacitance model for amorphous oxide semiconductors Thin Film Transistors (AOSTFTs) is validated in dynamic regime using a Ring Oscillator of 19 stages fabricated and measured, describing the model in Verilog-A language. In this paper, we obt