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Autor:
Paul A. Hyde, Richard Q. Williams, Jonghae Kim, W. Clark, V. Karam, B.J. Gross, Jean-Olivier Plouchart, Robert Trzcinski, Kun Wu, Myung-Hee Na, J. Mc Cullen
Publikováno v:
IEEE InternationalElectron Devices Meeting, 2005. IEDM Technical Digest..
This paper reports the SOI 90 nm statistical model to hardware correlation achieved over a broad voltage, temperature and a variety of five different ring oscillators. Monte Carlo simulations were performed and compared with the measured circuit stat