Zobrazeno 1 - 9
of 9
pro vyhledávání: '"J. M. Warlaumont"'
Publikováno v:
Journal of Vacuum Science and Technology. 19:1219-1223
A new wafer alignment mark is introduced which, when used in conjunction with a linear Fresnel zone plate on the mask, results in an alignment method with a wide range while retaining the high resolution implicit in the method. This new mark eliminat
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7835ff766fa249ed1355569c2e71751a
https://doi.org/10.1116/1.571248
https://doi.org/10.1116/1.571248
Publikováno v:
Journal of Applied Physics. 45:4045-4048
Stable and permanent niobium point‐contact SQUID's have been fabricated by using oxidized niobium screws to form the point contact. The reliability of these devices is further ensured by a simple and versatile environmental shielding procedure. Ove
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::572ed5ef899edd882e0b2f274572b387
https://doi.org/10.1063/1.1663910
https://doi.org/10.1063/1.1663910
Autor:
J. M. Warlaumont, J. R. Maldonado
Publikováno v:
Journal of Vacuum Science and Technology. 19:1200-1203
We have developed a high‐power stationary aluminum anode x‐ray exposure system in order to perform experiments and evaluate conventional resist processes, x‐ray mask substrates, and alignment techniques applicable to an x‐ray lithography syst
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5f31bc485765bd238005978aeb42bb71
https://doi.org/10.1116/1.571243
https://doi.org/10.1116/1.571243
Publikováno v:
Physical Review Letters. 45:1519-1523
This Letter reports the first ultrahigh-vacuum study of surface-enhanced Raman scattering from pyridine adsorbed on a clean single-crystal silver surface containing a smooth modulation (1 \ensuremath{\mu}m periodicity) to allow optical coupling to su
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::91a434b6372330c07a389f70a38747f9
https://doi.org/10.1103/physrevlett.45.1519
https://doi.org/10.1103/physrevlett.45.1519
Publikováno v:
Physical Review Letters. 43:169-172
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::df1ecb65c0cb332ee31d23091a3a432a
https://doi.org/10.1103/physrevlett.43.169
https://doi.org/10.1103/physrevlett.43.169
Publikováno v:
Applied Physics Letters. 28:353-355
Direct measurements have been made of the current‐phase relation (CPR) of photolithographic tin microbridges, scribed indium microbridges, proximity bridges, and point contacts. Hysteretic current‐phase relations have been observed in uniform‐t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::71668e9a80b5f0844b283fa769f4f27f
https://doi.org/10.1063/1.88756
https://doi.org/10.1063/1.88756
Publikováno v:
Applied Physics Letters. 29:214-216
The dc I‐V characteristics of superconducting thin‐film Sn‐Au proximity bridges and uniform‐thickness Sn microbridges have been carefully analyzed as a function of the directly measured current‐phase relation (CPR). At sufficiently low dc c
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4855e6c5aab232b814418fd478155aea
https://doi.org/10.1063/1.88998
https://doi.org/10.1063/1.88998
Publikováno v:
Vibrations at Surfaces ISBN: 9781468440607
High resolution electron energy loss (EELS), UV photoemission (UPS), low energy electron diffraction (LEED), Auger electron, and thermal desorption spectroscopic techniques have been applied to characterize the bonding, molecular orientation and vibr
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::64e30d7b7508a090978db1e944f4d1b7
https://doi.org/10.1007/978-1-4684-4058-4_36
https://doi.org/10.1007/978-1-4684-4058-4_36
Publikováno v:
Surface Enhanced Raman Scattering ISBN: 9781461592594
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::16d2af7b73456bd4d506623f3cc21105
https://doi.org/10.1007/978-1-4615-9257-0_10
https://doi.org/10.1007/978-1-4615-9257-0_10