Zobrazeno 1 - 7
of 7
pro vyhledávání: '"J. M. Walls"'
Autor:
A. Abbas, G. D. West, J. W. Bowers, P. Isherwood, P. M. Kaminski, B. Maniscalco, P. Rowley, J. M. Walls, K. Barricklow, W. S. Sampath, K. L. Barth
Publikováno v:
IEEE Journal of Photovoltaics. 3:1361-1366
Autor:
A. Abbas, G. D. West, J. W. Bowers, P. Isherwood, P. M. Kaminski, B. Maniscalco, P. Rowley, J. M. Walls, K. Barricklow, W. S. Sampath, K. L. Barth
Publikováno v:
2012 IEEE 38th Photovoltaic Specialists Conference (PVSC) PART 2.
Publikováno v:
Physical Review B. 86
Autor:
J. M. Walls, R. D. Webber
Publikováno v:
Radiation Effects. 45:111-118
The field-ion microscope has been used to investigate the depth of the structural damage caused to tungsten by low-energy ion bombardment. The bombardment geometry was such that the ions were incident in a direction parallel to the specimen axis, ⟨
Autor:
R D Webber, J M Walls
Publikováno v:
Journal of Physics D: Applied Physics. 12:1589-1595
The determination of the precise geometry of the field-ion emitter from its field-ion image has been a long-standing problem. An analytical method is given which allows the cartesian coordinates (x,y,z) of each imaging site to be determined using dat
Publikováno v:
Springer Series in Chemical Physics ISBN: 9783642827266
The advances made in UHV SIMS instrumentation (scanned ion probe/quadrupole analyser) have increased analytical capabilities in several areas: depth profiling using high current reactive ion (O2, Cs) or inert-gas ion probes, with or without oxygen ga
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d222fc557bf8aed8ae68e2e98bd282f7
https://doi.org/10.1007/978-3-642-82724-2_67
https://doi.org/10.1007/978-3-642-82724-2_67
Autor:
J. Huddleston, I. G. Hutchinson, T. B. Pierce, G. J. Davies, C. G. Tuppen, R. Heckingbottom, M. Gill, C. Heslop, A. B. Christie, I. Sutherland, J. Lee, J. M. Walls, J. C. Vickerman, M. Keenlyside, F. H. Stott, G. C. Wood
Publikováno v:
Analytical Proceedings. 20:476