Zobrazeno 1 - 2
of 2
pro vyhledávání: '"J. M. Struk"'
Publikováno v:
SPIE Proceedings.
Among existing x ray diffraction diagnostics nonperfections of crystals the specific location take methods are based on use of x-ray dynamic diffraction effects. From them the most sensitive are based on interferention. The Pendellosung and Moire fri
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1356c929db566389d2779dfa4d889fbb
https://doi.org/10.1117/12.226734
https://doi.org/10.1117/12.226734
Publikováno v:
SPIE Proceedings.
There are more than a dozen different methods of diagnostic and control of the structural purity of materials which are used in modern micro- and optoelectronics. Each of them has their own strong and weak points, range and fields of use. Usually a c
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bffb8036245b344db67dd4d126dcdca5
https://doi.org/10.1117/12.165401
https://doi.org/10.1117/12.165401