Zobrazeno 1 - 10
of 27
pro vyhledávání: '"J. M. Machefert"'
Publikováno v:
Surface and Interface Analysis. 17:137-142
The behaviour of the specular reflectance of several oxides on metals (Cr2O3 on Cr, Cu2O on Cu) has been studied theoretically and experimentally in the infrared region. Theoretical and experimental are in accordance with each other. The results obta
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e31d5d2c0ada90a5f7e6549dbacdd243
https://doi.org/10.1002/sia.740170304
https://doi.org/10.1002/sia.740170304
Publikováno v:
Surface and Interface Analysis. 16:289-292
The study of the oxidation of copper at low temperatures shows that the metal is not recovered by a pure stoichiometric Cu2O but by a copper(I) oxide phase with the same crystalline structure as Cu2O, and that this phase exhibits a very large non-sto
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d140605ec41333c7ef9688d90630f78b
https://doi.org/10.1002/sia.740160160
https://doi.org/10.1002/sia.740160160
Publikováno v:
Materials Research Bulletin. 23:1379-1388
The initial stages of copper oxidation were studied by UV-Vis-NIR diffuse reflectance spectroscopy, XPS, and by X-ray diffraction. An oxide, Cu x O, with an electronic structure different from the one of Cu 2 O, but with the same crystallographic str
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::04ec970d4a4f666a44a3b9b0db11b423
https://doi.org/10.1016/0025-5408(88)90262-0
https://doi.org/10.1016/0025-5408(88)90262-0
The oxidation process of copper begins with the growth of a precursor Cu x O having the same crystallographic structure as Cu 2 O but giving different XPS and UV spectra. The voltammogram of this oxide is different from that of bulk Cu 2 O and its ox
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6a63311016f43a491962f6d05c18bf98
https://doi.org/10.1016/s0167-2991(08)60723-5
https://doi.org/10.1016/s0167-2991(08)60723-5
Autor:
J. M. Welter, J. M. Machefert, R. Fontaine, M. Lecalvar, M. Lenglet, J. Arsene, P. Leterrible
Publikováno v:
Surface and Interface Analysis. 12:436-437
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e97d92852d38ad9d4017606a28620214
https://doi.org/10.1002/sia.740120718
https://doi.org/10.1002/sia.740120718
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Publikováno v:
Surface & Interface Analysis: SIA; 1991, Vol. 17 Issue 3, p137-142, 6p
Publikováno v:
Surface & Interface Analysis: SIA; 1990, Vol. 16 Issue 1-12, p289-292, 4p
Publikováno v:
Surface & Interface Analysis: SIA; 1990, Vol. 16 Issue 1-12, p315-317, 3p
Publikováno v:
Surface & Interface Analysis: SIA; 1990, Vol. 16 Issue 1-12, p317-318, 2p