Zobrazeno 1 - 2
of 2
pro vyhledávání: '"J. L. V. Ramana Kumari"'
Publikováno v:
2022 International Conference on Recent Trends in Microelectronics, Automation, Computing and Communications Systems (ICMACC).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::58b689490d4c380154228a2d0a80f28c
https://doi.org/10.1109/icmacc54824.2022.10093653
https://doi.org/10.1109/icmacc54824.2022.10093653
Publikováno v:
Lecture Notes in Electrical Engineering ISBN: 9788132227267
Test pattern generation Built-In Self Test (BIST) system is used to carryout testing operation of a circuit. We apply input vectors to the circuit based on logic implementation. A sequence of vectors are applied to the dadda multiplier circuit as inp
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::aa3e021da4055c1d5a457db4fee1229d
https://doi.org/10.1007/978-81-322-2728-1_67
https://doi.org/10.1007/978-81-322-2728-1_67
