Zobrazeno 1 - 10
of 15
pro vyhledávání: '"J. L. S. Lee"'
Publikováno v:
The Journal of Physical Chemistry C. 116:9311-9318
The sputtering yields of nanoparticles are expected to be higher than those for traditional flat films because of the higher surface area and lower volume to dissipate the primary ion energy. In the present study, gold nanoparticles in the size range
Publikováno v:
Surface and Interface Analysis. 44:238-245
A study is conducted on the effects of sample topography on the secondary ion mass spectrometry (SIMS) analysis of insulating samples, using poly(ethylene terephthalate) fibres (100 µm diameter) as a model system and simulations of the ion extractio
Publikováno v:
Surface and Interface Analysis. 44:1-14
A VAMAS interlaboratory study involving 21 time of flight secondary ion mass spectrometry (TOF SIMS) instruments from 9 countries has been conducted to evaluate the linearity of the instrumental intensity scale and procedures for intensity correction
Publikováno v:
Surface and Interface Analysis. 43:510-513
We present preliminary results of a VAMAS interlaboratory study on organic depth profiling, TWA2, sub-project A3 (d). A layered organic system was used to assess the repeatability and comparability of organic depth profiling. Nineteen respondents hav
Publikováno v:
Surface and Interface Analysis. 42:911-915
Partial least squares (PLS) regression has been increasingly used as a tool for modelling linear relations between multivariate surface analytical measurements and measures of performance. However, the use of PLS to obtain quantitative predictions ha
Publikováno v:
Surface and Interface Analysis. 42:129-138
An interlaboratory study involving 19 Time-of-Flight Static SIMS instruments from 12 countries has been conducted. Analysts were supplied, by NPL, with a protocol for analysis together with three reference materials; poly(tetrafluoroethylene) (PTFE),
Publikováno v:
Surface and Interface Analysis. 41:653-665
Despite the benefits of multivariate analysis methods, many challenges remain with their robust applications to real-life samples relevant to industry. Here, we use hair fibres pre-treated with a multi-component formulation to investigate different m
Publikováno v:
Applied Surface Science. 255:934-937
In the present study, the basic issues in C 60 n + sputtering are studied using silicon, gold and platinum samples. Sputtering yields are measured for energies in the range of 5–30 keV, by sputtering micrometre sized craters on the surface of flat
Publikováno v:
Applied Surface Science. 255:1560-1563
A detailed study is presented of the effects of surface topography on ToF-SIMS images, using experimental results from model conducting fibres, consisting of gold wires of diameters in the range of 33–125 μm mounted onto silicon wafers, and ion op
Publikováno v:
Surface and Interface Analysis. 40:1-14
Multivariate methods, such as principal component analysis (PCA) and multivariate curve resolution (MCR), are often employed to aid the analysis of large complex data sets such as time-of-flight secondary ion mass spectrometry (ToF-SIMS) images. Ther