Zobrazeno 1 - 10
of 36
pro vyhledávání: '"J. L. Elkind"'
Publikováno v:
The Journal of Physical Chemistry. 100:54-62
Guided ion beam mass spectrometry is used to examine the kinetic energy dependence of reactions of the second row transition metal cations, Y+, Zr+, Nb+, and Mo+, with molecular hydrogen and its isotopologues. By using a meter long flow tube ion sour
Publikováno v:
The Journal of Physical Chemistry. 99:10438-10445
Publikováno v:
ChemInform. 22
The reactions of Sc+, Ti+, and V+ with CO are studied as a function of translational energy in a guided‐ion‐beam tandem mass spectrometer. Formation of both metal‐carbide and metal‐oxide ions are observed and rationalized by a direct atom abs
Publikováno v:
The Journal of Chemical Physics. 95:3387-3393
The reactions of Sc+, Ti+, and V+ with CO are studied as a function of translational energy in a guided‐ion‐beam tandem mass spectrometer. Formation of both metal‐carbide and metal‐oxide ions are observed and rationalized by a direct atom abs
Autor:
L. S. Sunderlin, N. Aristov, David E. Clemmer, Ellen R. Fisher, P. B. Armentrout, R. Georgiadis, S. K. Loh, J. L. Elkind
Publikováno v:
The Journal of Chemical Physics. 93:2676-2691
Reactions of Ca+, Zn+ and all first‐row atomic transition metal ions with O2 are studied using guided ion beam techniques. While reactions of the ground states of Sc+, Ti+, and V+ are exothermic, the remaining metal ions react with O2 in endothermi
Publikováno v:
Journal of the American Chemical Society. 112:2083-2088
Guided ion beam mass spectrometry is used to examine the reaction of ground-state silicon ion with methane. Absolute cross sections of all products are measured from near-thermal to 14-eV relative kinetic energy. Only endothermic processes are observ
Publikováno v:
ChemInform. 21
Autor:
C. L. Littler, E. Maldonado, David G. Seiler, Z. Yu, J. L. Elkind, X. N. Song, Jeremiah R. Lowney
Publikováno v:
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 10:1466
A technique for studying low concentrations of trap levels in narrow‐gap Hg1−xCdxTe has been combined with the deliberate introduction of defects to determine the activation energies of these impurities in this ternary material. In this investiga
Autor:
J. L. Elkind
Publikováno v:
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 10:1460
Ion milling, a process believed to introduce interstitial mercury deeply into and type convert vacancy‐doped p‐HgCdTe, is shown to produce long‐range isotropic damage in n‐Hg1−xCdxTe (x=0.22). This damage is characterized by a bias‐depend
Publikováno v:
The Journal of Physical Chemistry. 93:3151-3158
The reactions of Sc{sup +}, Y{sup +}, La{sup +}, and Lu{sup +} with H{sub 2}, D{sub 2}, and HD are examined by use of guided ion beam mass spectrometry. Sc{sup +}, Y{sup +} and La{sup +} are found to react primarily via an insertion mechanism, while