Zobrazeno 1 - 10
of 133
pro vyhledávání: '"J. Kątcki"'
Autor:
Jacek Ratajczak, J. Kątcki, Marcin Myśliwiec, A. Piotrowska, Michał A. Borysiewicz, Andrzej Czerwiński, M. Ekielski, Marek Wzorek
Publikováno v:
Applied Surface Science. 369:535-544
Detailed microstructural studies were performed on Ni/Si ohmic contacts to silicon carbide in order to investigate the effect of initial Ni:Si ratio in as-deposited structures on the occurrence of characteristic defects in Ni silicide layers, such as
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::cedb871e8fd0f7e8c687afa77fa710ae
https://doi.org/10.1016/j.apsusc.2016.02.108
https://doi.org/10.1016/j.apsusc.2016.02.108
Autor:
Marcin Myśliwiec, J. Kątcki, A. Piotrowska, Michał A. Borysiewicz, Marek Wzorek, Andrzej Czerwiński, Krystyna Gołaszewska, Jacek Ratajczak
Publikováno v:
Materials Science and Engineering: B. 199:42-47
The new approach to fabrication process of nickel-based ohmic contacts to silicon carbide (SiC) is presented. During the first annealing step (300 °C), the amorphous Ni–Zr layer retards diffusion between two nickel silicide layers, thus handling t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f59f99615d797f976b0c7f478462702f
https://doi.org/10.1016/j.mseb.2015.04.012
https://doi.org/10.1016/j.mseb.2015.04.012
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. 348:106-110
The use of focused ion beam (FIB) for research or processing of nanostructures requires very accurate beam positioning. However, numerous reasons for beam-position fluctuations exist. When FIB is used for specimen imaging, then these beam fluctuation
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c578f697b6687c7e46f5f48038a2dd90
https://doi.org/10.1016/j.nimb.2014.11.020
https://doi.org/10.1016/j.nimb.2014.11.020
Publikováno v:
Polish Journal of Chemical Technology, Vol 16, Iss 3, Pp 40-44 (2014)
The capabilities and applications of the focused ion beam (FIB) technology for detection of an electrochemical signal in nanoscale area are shown. The FIB system, enabling continuous micro- and nanofabrication within only one equipment unit, was used
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::27fb16a0aa4e3a86b94654221dfb857d
https://doi.org/10.2478/pjct-2014-0048
https://doi.org/10.2478/pjct-2014-0048
Publikováno v:
Acta Physica Polonica A. 125:1027-1032
Cathodoluminescence and photoluminescence measurements are commonly accepted as revealing local properties of a specimen region excited by a beam of electrons or photons. However, in the presence of a strong electric eld (e.g. a junction) an electron
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::04780b802e6c2e0ed619adccd30fccae
https://doi.org/10.12693/aphyspola.125.1027
https://doi.org/10.12693/aphyspola.125.1027
Autor:
Marek Wzorek, A. Czerwinski, Jacek Ratajczak, Andrian Kuchuk, J. Kątcki, Michał A. Borysiewicz, Anna Piotrowska
Publikováno v:
Materials Science Forum. :697-701
Distribution of chemical composition in nickel-based ohmic contacts ton-type 4H-SiC was investigated with XEDS mapping performed on plan-view and cross-sectional TEM samples. Obtained results indicate that local deviations in stoichiometry from that
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::09618aaea18dabb3a8660492b5b6427b
https://doi.org/10.4028/www.scientific.net/msf.778-780.697
https://doi.org/10.4028/www.scientific.net/msf.778-780.697
Publikováno v:
Physica B: Condensed Matter. 407:2854-2857
Cathodoluminescence (CL) in scanning electron microscopy (SEM) is commonly accepted as revealing local properties of a specimen region illuminated by an electron beam. CL is widely used to visualize defects in semiconductor structures. However, the p
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::dac9cc976720666248298ad2a3cd0365
https://doi.org/10.1016/j.physb.2011.08.095
https://doi.org/10.1016/j.physb.2011.08.095
Publikováno v:
Solid State Phenomena. 186:20-23
Cathodoluminescence (CL) in SEM and electroluminescence (EL) techniques are widely used for investigation of optical properties of electronic structures. It is assumed that the CL signal represents the local properties of the region irradiated by the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a8088b5d46dcd2a2a9c6f53604402877
https://doi.org/10.4028/www.scientific.net/ssp.186.20
https://doi.org/10.4028/www.scientific.net/ssp.186.20
Autor:
Jacek Ratajczak, A. Łaszcz, Andrzej Taube, J. Kątcki, Sylwia Gieraltowska, A. Piotrowska, A. Czerwinski
Publikováno v:
Solid State Phenomena. 186:78-81
Transmission electron microscopy (TEM) techniques were used for characterization of annealing (400, 600 and 800 °C) influence on the structural properties of the HfO2 film (45 nm thick) deposited on Si substrate. Such structures are considered as hi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c96d5df82c88caa7cc35a8bbad1c051f
https://doi.org/10.4028/www.scientific.net/ssp.186.78
https://doi.org/10.4028/www.scientific.net/ssp.186.78
Publikováno v:
Solid State Phenomena. 186:82-85
Ni/Si multilayer contact structures to 4H-SiC after subsequent annealing steps are investigated with electron microscopy methods. After high temperature annealing step, specific defects in the contact structures are observed. The influence of phase t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ed998d5fa85e1e15f8d548fef5d06a37
https://doi.org/10.4028/www.scientific.net/ssp.186.82
https://doi.org/10.4028/www.scientific.net/ssp.186.82