Zobrazeno 1 - 5
of 5
pro vyhledávání: '"J. J. Hohlfelder"'
Autor:
D. L. Fehl, G. A. Chandler, W. A. Stygar, R. E. Olson, C. L. Ruiz, J. J. Hohlfelder, L. P. Mix, F. Biggs, M. Berninger, P. O. Frederickson, R. Frederickson
Publikováno v:
Physical Review Special Topics. Accelerators and Beams, Vol 13, Iss 12, p 120403 (2010)
A five-channel, filtered-x-ray-detector (XRD) array has been used to measure time-dependent, soft-x-ray flux emitted by z-pinch plasmas at the Z pulsed-power accelerator (Sandia National Laboratories, Albuquerque, New Mexico, USA). The preceding, com
Externí odkaz:
https://doaj.org/article/0368da04bd8d41eca4c40c9271e97b76
Autor:
D. L. Fehl, G. A. Chandler, W. A. Stygar, R. E. Olson, C. L. Ruiz, J. J. Hohlfelder, L. P. Mix, F. Biggs, M. Berninger, P. O. Frederickson, R. Frederickson
Publikováno v:
Physical Review Special Topics. Accelerators and Beams, Vol 13, Iss 12, p 120402 (2010)
An algorithm for spectral reconstructions (unfolds) and spectrally integrated flux estimates from data obtained by a five-channel, filtered x-ray-detector array (XRD) is described in detail and characterized. This diagnostic is a broad-channel spectr
Externí odkaz:
https://doaj.org/article/09481b3fe3fc4d288f6ff0eda4f5b654
Autor:
M. Berninger, Gordon A. Chandler, P. O. Frederickson, F. Biggs, R. E. Olson, R. Frederickson, L. P. Mix, J. J. Hohlfelder, Carlos L. Ruiz, D. L. Fehl, William A. Stygar
Publikováno v:
Physical Review Special Topics - Accelerators and Beams. 13
An algorithm for spectral reconstructions (unfolds) and spectrally integrated flux estimates from data obtained by a five-channel, filtered x-ray-detector array (XRD) is described in detail and characterized. This diagnostic is a broad-channel spectr
Autor:
M. A. Palmer, J. J. Hohlfelder
Publikováno v:
Advances in X-ray Analysis. 18:136-145
A pinhole camera has been used to record low-energy x rays produced from CD2 microsphere irradiation with Sandia Laboratories four-beam, pulsed laser system. Camera useful energy range, spatial resolution, and x-ray energy sensitivity are discussed.
Autor:
J. J. Hohlfelder, M. A. Palmer
Publikováno v:
Advances in X-Ray Analysis ISBN: 9781461399803
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::54c6196fc3e6db56a386231ef1b04ce5
https://doi.org/10.1007/978-1-4613-9978-0_8
https://doi.org/10.1007/978-1-4613-9978-0_8