Zobrazeno 1 - 10 of 46 pro vyhledávání: '"J. J. FRIEL"'
1
A direct determination of fractal dimension of fracture surfaces using scanning electron microscopy and stereoscopy
Autor: C. S. Pande, J. J. Friel
Publikováno v: Journal of Materials Research. 8:100-104
A rapid and accurate method of measuring fractal dimension of a fractured surface is described. The method uses a stereo pair of photomicrographs taken in a scanning electron microscope and digitized for computer analysis. The computer can automatica
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::d1d2693324e1782805c6cbb24e5604d2
https://doi.org/10.1557/jmr.1993.0100
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3
Saving the photons: mapping X-rays by position-tagged spectrometry
Autor: R. B. Mott, J. J. Friel
Publikováno v: Journal of microscopy. 193(1)
Since the early years of X-ray spectrometry in electron microscopes, mapping the locations of chemical elements has been important. The X-rays needed in large numbers for this are rare, owing to poor production efficiency compared with electron signa
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d13ca79a8a2af8da8bd49c851f45160f
https://pubmed.ncbi.nlm.nih.gov/12558682
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4
Improving EDS Performance with Digital Pulse Processing
Autor: R. B. Mott, J. J. Friel
Publikováno v: X-Ray Spectrometry in Electron Beam Instruments ISBN: 9781461357384
Direct digitization of the preamplifier output of a Si(Li) detector, with all subsequent pulse processing performed digitally, enhances throughput versus resolution performance Sensitivity, resolution, and especially pileup rejection for photons belo
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::18e4adcf475ab3313c4158e3660b4229
https://doi.org/10.1007/978-1-4615-1825-9_9
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7
Low-voltage microscopy and position-tagged spectrometry of ceramic microstructures
Autor: J. J Friel, V. A. Greenhut
Publikováno v: Proceedings, annual meeting, Electron Microscopy Society of America. 54:682-683
Ceramic microstructures are ideally suited for low-voltage field emission microscopy on uncoated samples. Most elements of interest in ceramics have useful X-ray lines below 5 keV, thus permitting the use of accelerating voltages between 3 and 8 kV.
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::766140de52f6b624d0ebeb1fa6df961a
https://doi.org/10.1017/s0424820100165872
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8
Atmospheric Corrosion Products on Al, Zn, and AlZn Metallic Coatings
Autor: J. J. Friel
Publikováno v: CORROSION. 42:422-426
Because the atmospheric corrosion products that form on the surface of Al, Zn, and AlZn hot-dip coatings on sheet steel are difficult to characterize, they have not been extensively studied in the past. In this study, the composition and structure of
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::83273ac3b95aaaa7eb06acca583ab9cb
https://doi.org/10.5006/1.3584923
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