Zobrazeno 1 - 3
of 3
pro vyhledávání: '"J. Isker"'
Autor:
R. El Fatimy, Anju Vasudevan, S. Fish, E. Abdallah, Virginia Camacho, Maximilian Y. Emmert, J. Isker, Elisabeth M. Battinelli, H. Rodriguez Cetina Biefer, F. Roberts, A. J. Loscalzo, Yeqi Nian, Joseph Loscalzo
Publikováno v:
The Thoracic and Cardiovascular Surgeon.
Publikováno v:
SPIE Proceedings.
System-level performance testing of IR focal plane arrays (FPAs) at low background flux has been demonstrated prior to system- level integration using an optical simulator designed at the Hughes Technology Center. The optical simulator uses 30K coole
Publikováno v:
SPIE Proceedings.
Routine cryowafer probe testing of readout integrated circuits at T equals 80 K has been demonstrated at the Hughes Aircraft Company Technology Center. This new method of wafer testing at cryogenic temperatures has greatly reduced the test time neede