Zobrazeno 1 - 10
of 48
pro vyhledávání: '"J. F. Morar"'
Autor:
Philip E. Batson, J. F. Morar
Publikováno v:
Physical Review Letters. 71:609-612
Spatially resolved electron energy loss spectra of the Si 2p core excitation are obtained in transmission through a single cross section of a 3 nm thick Ge 40 Si 60 quantum well. The spectra yield the positions of the L 1 and Δ 1 conduction band min
Publikováno v:
Journal of Applied Physics. 71:4230-4243
Compositionally graded films of SiGe/Si(100) and GaInAs/GaAs were grown under different conditions in order to investigate the different modes of strain relaxation associated with the compositional grading. We show that, when the growth conditions ar
Publikováno v:
Applied Physics Letters. 61:192-194
We report the first measurements of band‐gap energy versus applied hydrostatic pressure in the Si1−xGex system, a result achievable only with the recent availability of high‐quality alloys. The Si/Si1−xGex (x=0.05–0.25) quantum wells used h
Autor:
J. F. Morar, Philip E. Batson
Publikováno v:
Applied Physics Letters. 59:3285-3287
Transmission electron energy‐loss spectroscopy has been used to follow the positions of the Δ1 and L1 conduction‐band minima, and the L3 saddle point, as a function of Ge content in GexSi1−x (x=0–0.95) alloys. By analyzing the shape of the S
Publikováno v:
Physical review. B, Condensed matter. 47(7)
We describe a new method for determining band lineups at semiconductor heterojunctions, applicable to Si-Ge systems. Spatially resolved transmission electron-energy-loss spectroscopy is used to detect bulk core-to-conduction-band transitions in alloy
Publikováno v:
The Physics and Chemistry of SiO2 and the Si-SiO2 Interface 2 ISBN: 9781489915900
The distribution of oxidation states at various SiO2/Si interfaces is determined using surface-sensitive, high-resolution Si2p core level spectroscopy with synchrotron radiation. It provides a critical test of current structural models for the interf
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e35d140b5d26009a6ee17a9cad837ffb
https://doi.org/10.1007/978-1-4899-1588-7_25
https://doi.org/10.1007/978-1-4899-1588-7_25
Publikováno v:
Physical review letters. 66(22)
We describe anomalous strain relaxation in graded SiGe superlattices and thin films. This relaxation is characterized by the presence of dislocations in the Si substrate, as well as in the lower part of the film or superlattice, and results in a disl
Autor:
Philip E. Batson, J. F. Morar
Publikováno v:
Proceedings, annual meeting, Electron Microscopy Society of America. 51:816-817
Ge/Si quantum well structures show a high hole mobility as the heavy hole bands are shifted to lower energy under bi-axial strain produced by lattice mismatch between the well and the Si substrate. This strain can also split and shift the conduction
Publikováno v:
Proceedings, annual meeting, Electron Microscopy Society of America. 50:1340-1341
The positions of the band edges on either side of a semi-conductor heterojunction determine the electrical properties of the interface by defining the potential barrier to transport experienced by an electron or hole. This behavior dominates the func
Autor:
Philip E. Batson, J. F. Morar
Publikováno v:
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures. 10:2022
The energies of the Δ1 and L1 conduction band minima and the L3 saddle point have been measured in Si1−xGex (x=0.0–0.95) alloys using spatially resolved electron energy‐loss spectroscopy. Measurements were carried out in a scanning transmissio