Zobrazeno 1 - 5
of 5
pro vyhledávání: '"J. E. Velazquez-Perez"'
Autor:
O. Castelló, Sofía M. López Baptista, K. Watanabe, T. Taniguchi, E. Diez, J. E. Velázquez-Pérez, Y. M. Meziani, J. M. Caridad, J. A. Delgado-Notario
Publikováno v:
Frontiers of Optoelectronics, Vol 17, Iss 1, Pp 1-11 (2024)
Abstract In recent years, graphene field-effect-transistors (GFETs) have demonstrated an outstanding potential for terahertz (THz) photodetection due to their fast response and high-sensitivity. Such features are essential to enable emerging THz appl
Externí odkaz:
https://doaj.org/article/130a1a7c85b94b91930873fb29b73e8d
Autor:
K. Fobelets, S. L. Rumyantsev, P. W. Ding, J. E. Velazquez-Perez, Massimo Macucci, Giovanni Basso
Publikováno v:
AIP Conference Proceedings.
Screen‐Grid Field Effect Transistors (SGrFETs) are multi‐gate devices with a novel gate geometry consisting of oxide wrapped metal cylinders standing perpendicular to the current flow between source and drain. TCAD simulations show robust downsca
Autor:
J. A. Delgado-Notario, V. Clericò, E. Diez, J. E. Velázquez-Pérez, T. Taniguchi, K. Watanabe, T. Otsuji, Y. M. Meziani
Publikováno v:
APL Photonics, Vol 5, Iss 6, Pp 066102-066102-8 (2020)
A graphene-based field-effect-transistor with asymmetric dual-grating gates was fabricated and characterized under excitation of terahertz radiation at two frequencies: 0.15 THz and 0.3 THz. The graphene sheet was encapsulated between two flakes of h
Externí odkaz:
https://doaj.org/article/81534aa23ce5451bba28a39fe004fb9d
Publikováno v:
ResearcherID
MOS-gated strained-Si modulation doped Field Effect Transistors (MOSMODFETs) traditionally suffer from parallel conduction causing degradation of the device performance below that of the Si control fabricated in the same batch. We present a MOSMODFET
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f6dc0f08da4529475ce56767b005c8dd
http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=ORCID&SrcApp=OrcidOrg&DestLinkType=FullRecord&DestApp=WOS_CPL&KeyUT=WOS:000207330100006&KeyUID=WOS:000207330100006
http://gateway.webofknowledge.com/gateway/Gateway.cgi?GWVersion=2&SrcAuth=ORCID&SrcApp=OrcidOrg&DestLinkType=FullRecord&DestApp=WOS_CPL&KeyUT=WOS:000207330100006&KeyUID=WOS:000207330100006