Robust DC and efficient time-domain fast fault simulation

Autor: Tasic, Bratislav, J. Dohmen, Jos, Jan W. ter Maten, E., G.J. Beelen, Theo, H.A. Schilders, Wil, de Vries, Alex, van Beurden, Maikel

Publikováno v: COMPEL: The International Journal for Computation and Mathematics in Electrical and Electronic Engineering, 2014, Vol. 33, Issue 4, pp. 1161-1174.

Externí odkaz: http://www.emeraldinsight.com/doi/10.1108/COMPEL-12-2012-0364