Zobrazeno 1 - 10
of 176
pro vyhledávání: '"J. Deri"'
Autor:
Brendan A. Reagan, MariAnn Albrecht, David Alessi, Mark Ammons, Saumyabrata Banerjee, Cris Barillas, Frantisek Batysta, Brandon Buckley, Alex Chemali, Erin Clark, Edwin Davila, Robert J. Deri, Kevin Eseltine, Barry Fishler, Steve Fulkerson, Justin Galbraith, Thomas Galvin, Anthony Gonzales, Vinod Gopalan, Sandrine Herriot, Zbnek Hubka, Jessica Jimenez, Leily Kiani, Ed Koh, Rotem Kupfer, Zhi Liao, Jeremy Lusk, Hoang Nguyen, Ashay Patel, Aaron Peer, John Peterson, Robert Plummer, Kathleen Schaffers, Emily Sistrunk, Thomas M. Spinka, Christopher Stolz, Issa Tamer, Vincent Tang, Steve Telford, Kenneth Terzi, Pamela Utley, Katherine M. Velas, Anthony Vella, Nan Wong
Publikováno v:
High Power Lasers for Fusion Research VII.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1ecd9c329f91bf492e1067840e99257b
https://doi.org/10.1117/12.2650137
https://doi.org/10.1117/12.2650137
Akademický článek
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Autor:
Seval Arslan, Hans Wenzel, Jörg Fricke, Andreas Thies, Arnim Ginolas, Christoph Stölmacker, Andre Maassdorf, Bernd Eppich, Rebecca B. Swertfeger, Susant K. Patra, Robert J. Deri, Matthew C. Boiselle, David L. Pope, Paul O. Leisher, Günther Tränkle, Paul A. Crump
Publikováno v:
Novel In-Plane Semiconductor Lasers XXI.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bd1aa8da56d14a656287b5066af51431
https://doi.org/10.1117/12.2609391
https://doi.org/10.1117/12.2609391
Autor:
Jason D. Helmrich, Daniel B. Fullager, Chen Li, Mark T. Crowley, Paul O. Leisher, Prabhu Thiagarajan, Rebecca B. Swertfeger, Kevin P. Pipe, Robert J. Deri, Aman Kumar Jha
Publikováno v:
IEEE Photonics Technology Letters. 31:1909-1912
Severe heating due to partial absorption of outcoupled emission at the facet of a high-power diode laser can lead to catastrophic optical damage. The degree of absorption and subsequent heating at the facet is a function of the emission wavelength, t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::edf502d0888f2df822caf5aee79db4a4
https://doi.org/10.1109/lpt.2019.2949281
https://doi.org/10.1109/lpt.2019.2949281
Autor:
Aman Kumar Jha, Chen Li, Eyal Feigenbaum, Robert J. Deri, Mark T. Crowley, Paul O. Leisher, Prabhu Thiagarajan, Kevin P. Pipe, Daniel B. Fullager, Jason D. Helmrich, Rebecca B. Swertfeger
Publikováno v:
IEEE Journal of Selected Topics in Quantum Electronics. 25:1-13
In optical systems employing high-power diode lasers, back-irradiance of emission onto the laser facet has been found to contribute to catastrophic optical damage. In this paper, thermoreflectance imaging has been used to measure quantum well tempera
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ba3e6cc1dac520ec3bdd79d3297bef5f
https://doi.org/10.1109/jstqe.2019.2908556
https://doi.org/10.1109/jstqe.2019.2908556
Autor:
Chen Li, Paul O. Leisher, Jason D. Helmrich, Prabhu Thiagarajan, Matthew C. Boisselle, Susant Patra, Kevin P. Pipe, Robert J. Deri, Sezer Sezgin, Aman Kumar Jha
Publikováno v:
IEEE Journal of Quantum Electronics. 54:1-13
Catastrophic failure of diode pumps in laser systems exhibiting back-irradiance is a common occurrence yet poorly understood. Prior paper has established boundaries for time-zero failures, but these results cannot be used to deduce safe back-irradian
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8434a0abc449b6345c66e2869aaec0c2
https://doi.org/10.1109/jqe.2018.2873073
https://doi.org/10.1109/jqe.2018.2873073
Autor:
Paul O. Leisher, Robert J. Deri, Rebecca B. Swertfeger, Matthew C. Boisselle, Hans Wenzel, D. L. Pope, Susant Patra, S. Arslan, Christoph Stölmacker, J. Fricke, Paul Crump, Arnim Ginolas
Publikováno v:
2020 IEEE Photonics Conference (IPC).
Experiment and simulation of high power diode lasers reveals a longitudinally-varying current density profile, due to spatial hole-burning. Current crowding at the front facet increases with cavity length and bias, and limits the achievable power.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5853d8b14b5f68bbbce4feaa3a35220e
https://doi.org/10.1109/ipc47351.2020.9252427
https://doi.org/10.1109/ipc47351.2020.9252427
Autor:
Mark T. Crowley, Aman Kumar Jha, Chen Li, Daniel B. Fullager, Robert J. Deri, Paul O. Leisher, Rebecca B. Swertfeger, Prabhu Thiagarajan, Jason D. Helmrich, Kevin P. Pipe
Publikováno v:
Components and Packaging for Laser Systems VI.
Light absorption at the facet of a high power diode laser can lead to severe heating and catastrophic optical damage. In this work, a combination of high resolution thermoreflectance imaging and a detailed heat transport model of the diode chip are u
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2c05d8cd3c3dba9a8839c169d9b4e5a0
https://doi.org/10.1117/12.2547344
https://doi.org/10.1117/12.2547344
Autor:
Jason D. Helmrich, Mark T. Crowley, Daniel B. Fullager, Chen Li, Aman Kumar Jha, Rebecca B. Swertfeger, Eyal Feigenbaum, Kevin P. Pipe, Robert J. Deri, Paul O. Leisher, Prabhu Thiagarajan
Publikováno v:
2019 IEEE High Power Diode Lasers and Systems Conference (HPD).
Thermoreflectance imaging enables noncontact mapping of surface temperature with high spatial resolution and high temperature resolution in electronic and optoelectronic devices. Recently we have applied charge-coupled device (CCD) based thermoreflec
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::235477c7f2ebb89e2f579fbaa1cb00d0
https://doi.org/10.1109/hpd48113.2019.8938679
https://doi.org/10.1109/hpd48113.2019.8938679