Zobrazeno 1 - 10
of 11
pro vyhledávání: '"J. D. Kuptsis"'
Publikováno v:
Journal of Electronic Materials. 4:429-444
A chemical vapor deposition process for depositing dielectric films of aluminum oxynitride is described. AlCl3, CO2 and NH3 were employed as the reactive gases in a nitrogen carrier. Films were grown from the mixed gases at 770 and 900°C in a resist
Publikováno v:
Journal of Physics D: Applied Physics. 11:2633-2642
A modified equation is proposed for the X-ray production range of 2-15 keV electrons in solids. The modification is obtained by an experimental procedure which compares the difference in X-ray intensities between pure element thin films and 'bulk' st
Publikováno v:
Journal of Vacuum Science and Technology. 15:281-287
An unexpected substrate etching phenomenon during the sputtering of certain intermetallic compounds has been found to be caused by a large flux of negative metal ions from the sputtering target. The substrates directly under the target in a diode geo
Publikováno v:
IBM Journal of Research and Development. 21:580-583
An unexpected etching phenomenon during the sputtering of rare earth-gold alloys has been found to be caused by a large flux of negative gold ions from the sputtering target. We find this effect to occur in a range of intermetallic compounds. A model
Autor:
J. C. Lloyd, J. D. Kuptsis
Publikováno v:
Advances in X-ray Analysis. 6:389-395
Analysis schemes for eleven rare earths (Ce, Pr, Nd, Sm, Eu, Tb, Dy, Ho, Er, Tm, Yb) taken singly in Y-Fe garnet powders are presented. Straight-line calibrations result in all cases, usually over a range from below 0.5 wt.% to better than 6 wt.%. Er
Publikováno v:
Applied Physics Letters. 40:90-92
Conducting organic charge-transfer salts made up of organic π donors as TTF and TTT and halogen acceptors are shown to be electron beam resist materials having a combination of unique features with no parallel among conventional resist materials.
Autor:
Y. Tomkiewicz, N. S. Shiren, T. D. Schultz, K. Mortensen, M. L. W. Thewalt, J. D. Kuptsis, R. G. Schad, B. H. Robinson, T. C. Clarke, G. B. Street, H. Thomann, L. R. Dalton, H. B. Brom
Publikováno v:
Springer Series in Solid-State Sciences ISBN: 9783642815942
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1d8a1e1fe9d3e4a1c464d04ca5f04d22
https://doi.org/10.1007/978-3-642-81592-8_24
https://doi.org/10.1007/978-3-642-81592-8_24
Publikováno v:
Chemischer Informationsdienst. 5
Publikováno v:
ACS Symposium Series ISBN: 9780841207158
Polymer Materials for Electronic Applications
Polymer Materials for Electronic Applications
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4a4e925c2e791cbc93ec58008e15f114
https://doi.org/10.1021/bk-1982-0184.ch007
https://doi.org/10.1021/bk-1982-0184.ch007
Autor:
J C Lloyd, J D Kuptsis
Publikováno v:
Advances in X-Ray Analysis ISBN: 9781468487855
Analysis schemes for eleven rare earths (Ce, Pr, Nd, Sm, Eu, Tb, Dy, Ho, Er, Tm, Yb) taken singly in Y-- Fe garnet powders are presented. Straight-line calibrations result in all cases, usually over a range from below 0.5 wt% to better than 6 wt%. Er
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d579314ae900c3ca1588b2eca7c4594a
https://doi.org/10.1007/978-1-4684-8783-1_37
https://doi.org/10.1007/978-1-4684-8783-1_37