Zobrazeno 1 - 8
of 8
pro vyhledávání: '"J. D. Gressett"'
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. :98-103
L-shell X-ray production cross sections have been measured for thin-foil targets of 29 Cu, 32 Ge, 37 Rb, 38 Sr and 39 Y for incident proton beam energies from 100 to 225 keV. Simultaneous measurements were made of both scattered particles and X-rays
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. :116-120
M-shell X-ray production cross sections have been measured for thin-foil targets (thickness in μg/cm2) of 79Au (7.0), 82Pb (10.6), 83Bi (4.1), 90Th (7.9) and 92U (8.8) for 70–200 keV incident protons. These data are compared to other measurements
Autor:
D.L. Maxson, Floyd D. McDaniel, J.M. Anthony, Jerome L. Duggan, J. D. Gressett, H.J. Mackey, S. Matteson
Publikováno v:
Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms. :755-758
The determination of trace impurities in electronic materials using accelerator mass spectrometry (AMS) requires efficient automation of the beam transport and mass discrimination hardware. The ability to choose between a variety of charge states, is
Autor:
J. D. Gressett, P.D. Miller, Floyd D. McDaniel, R. S. Peterson, Grzegorz Lapicki, Jerome L. Duggan, S. R. Wilson, A. Toten
Publikováno v:
Physical Review A. 19:1517-1524
This article discusses projectile-charge-state dependence of target L-shell ionization by 1.86-MeV/amu and silicon ions and 1.8-MeV/amu chlorine ions.
Autor:
R. S. Peterson, Floyd D. McDaniel, S. R. Wilson, P.D. Miller, A. Toten, Jerome L. Duggan, Grzegorz Lapicki, J. D. Gressett
Publikováno v:
IEEE Transactions on Nuclear Science. 26:1143-1146
Lα x-ray production cross sections have been measured for thin solid targets of 60Nd, 67Ho, and 79Au (pt
Autor:
Stephen Krause, Syd R. Wilson, Rich Gregory, J. D. Gressett, Robert G. Downing, A. H. Hamdi, F. D. McDaniel, Wayne M. Paulson
Publikováno v:
Journal of The Electrochemical Society. 132:922-929
Presentation des variations des proprietes electriques en fonction du temps d'exposition, de la temperature de chauffe et de l'espece dopant. Correlation de ces effets a la croissance de grain et a la diffusion du dopant
Autor:
J. D. Gressett, Syd R. Wilson, Floyd D. McDaniel, Wayne M. Paulson, A. H. Hamdi, Rich Gregory
Publikováno v:
Applied Physics Letters. 45:464-466
The diffusion of As in polycrystalline silicon films subjected to rapid thermal annealing has been studied using sheet resistance and Rutherford backscattering. The polycrystalline Si films were deposited on oxidized silicon wafers, implanted with As
Autor:
R. S. Thoe, T. M. Button, G. D. Alton, J. D. Gressett, Jerome L. Duggan, R. S. Peterson, P.D. Miller, M. C. Andrews, R. K. Rice, Floyd D. McDaniel, A. Toten
Publikováno v:
IEEE Transactions on Nuclear Science. 26:1157-1158
Hartree-Fock momentum wavefunctions have been used with the impulse approximation (IA) to calculate lineshapes for radiative electron capture (REC) x-rays emitted in 199F+q (q=8,9) collisions with 10Ne. The validity of the IA for these collisions wil