Zobrazeno 1 - 10
of 22
pro vyhledávání: '"J. Cruz-Colon"'
Publikováno v:
2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1b17d9417cc4451d21e37b79fdebdd16
https://doi.org/10.1109/redw56037.2022.9921486
https://doi.org/10.1109/redw56037.2022.9921486
Publikováno v:
2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::195900011ddfd04f9f0d6312dad2c473
https://doi.org/10.1109/nsrec45046.2021.9679345
https://doi.org/10.1109/nsrec45046.2021.9679345
Publikováno v:
2019 IEEE Radiation Effects Data Workshop.
Single Event Effects and Total Ionizing Dose characterization results for the TPS7H2201-SP are summarized. The data shows the device is SEL-free (at T$\approx$125 °C), SEB-free, SEGR-free, SEFI-free and SET-free (at T$\approx$23 °C) up to LET EFF =
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a690dcc3cae5266dd1d04a4e41311fdc
https://doi.org/10.1109/redw.2019.8906601
https://doi.org/10.1109/redw.2019.8906601
Publikováno v:
2018 18th European Conference on Radiation and Its Effects on Components and Systems (RADECS).
Single Events Effect (SEE) and Total Ionizing Dose (TID) characterization results for the new TPS50601A-SP, 6 A, DC-DC converter from Texas Instruments are presented. The TPS50601A-SP is Radiation Hardness Assured (RHA) up to a TID=100 krad (Si) for
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::67e814c6d1ad0cd8025733d8233e0b05
https://doi.org/10.1109/radecs45761.2018.9328718
https://doi.org/10.1109/radecs45761.2018.9328718
Publikováno v:
2018 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2018).
Single Events Effect (SEE) characterization results for HVD233-SP CAN Transceiver is summarized. No SEL up to LET EFF =92MeV was observed, cross section plot with Weibull fit are presented for dynamic testing up to LET EFF =92MeV.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9fce9a549270f17b28b205f7c68dab8b
https://doi.org/10.1109/nsrec.2018.8584316
https://doi.org/10.1109/nsrec.2018.8584316
Publikováno v:
2017 IEEE Radiation Effects Data Workshop (REDW).
Single Events Effect (SEE) characterization results for LVPECL 1:10 Clock Distributor is summarized, showing very robust SEE performance up to LET eff =69.2 MeV-cm2/mg.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::cb84c1375da76ad7fff7d98a38efb134
https://doi.org/10.1109/nsrec.2017.8115461
https://doi.org/10.1109/nsrec.2017.8115461
Publikováno v:
2017 IEEE Radiation Effects Data Workshop (REDW).
The SEE, TID, and SET effects of the LMH5401-SP, industry leading fully differential amplifier, are presented. No latch up events were observed up to an LET of 85 MeV.cm2/mg at 125 C.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::af6b567f1a07dcd1b92fd316d0b66907
https://doi.org/10.1109/nsrec.2017.8115459
https://doi.org/10.1109/nsrec.2017.8115459
Publikováno v:
2016 IEEE Radiation Effects Data Workshop (REDW).
Single Events Effect (SEE) and Total Ionizing Dose (TID) results for a new Double Data Rate (DDR) linear voltage regulator are summarized, demonstrating robust SEE performance up to LETeff=65.1 MeV-cm2/mg and TID up to 100k Rads(Si).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b8b08bdf58648994b2e2d44d0af18920
https://doi.org/10.1109/nsrec.2016.7891727
https://doi.org/10.1109/nsrec.2016.7891727
Publikováno v:
Physical Medicine and Rehabilitation Clinics of North America. 21:711-724
Myofascial pain syndrome is a common nonarticular local musculoskeletal pain syndrome caused by myofascial trigger points located at muscle, fascia, or tendinous insertions, affecting up to 95% of people with chronic pain disorders. Clinically, myofa
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9de8ef0458db3ae395dd226d89afa83c
https://doi.org/10.1016/j.pmr.2010.07.003
https://doi.org/10.1016/j.pmr.2010.07.003
Autor:
Tamer San, J. Rodriguez-Latorre, Thang Trinh, J. Cruz-Colon, C. Zhou, S. Khan, B. A. Dahl, J. A. Rodriguez, R. C. Baumann
Publikováno v:
2015 IEEE Radiation Effects Data Workshop (REDW).
Radiation and Temperature Characterization results of a 2T-2C ferroelectric random access memory (FRAM) are presented. This includes Total Ionizing Dose (TID), Single Event Effects (SEE) and Temperature evaluation at 215 oC.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1bde6a4bc31d2d8f7263e61e5c20559a
https://doi.org/10.1109/redw.2015.7336729
https://doi.org/10.1109/redw.2015.7336729