Zobrazeno 1 - 10
of 53
pro vyhledávání: '"J. Ch. Garcia"'
Publikováno v:
Journal of Crystal Growth. :891-895
Low-resistivity Ga(In)As tunnel junctions have been used to interconnect epitaxially two separate confinement heterostructure (SCH) InGaAs/GaAlAs laser structures. Laser structures consist of a 0.2 μm GaAs optical cavity containing three Ga 0.88 In
Publikováno v:
Journal of Crystal Growth. :614-618
In situ AsCl3 etching of (1 1 1)A, (1 1 1)B and (0 0 1) GaAs layers has been studied as a function of substrate temperature in the range of 450–600°C. The (1 1 1)A and (0 0 1) show qualitatively the same etching behavior. For both substrates, the
Autor:
J. Ch. Garcia
Publikováno v:
Journal of Crystal Growth. 188:343-348
In the last decade, development of growth technologies has been the main factor driving the advancement of III–V semiconductor electronic and optoelectronic devices. Today, epitaxial growth technologies can be classified into two types: the ultra h
Publikováno v:
Journal of Electronic Materials. 27:442-445
We report on the complete characterization of a hydride- and hydrogen-free chemical beam epitaxy (CBE) process for the realization of GaAs/GaInP heterojunction bipolar transistors. Alternative group V sources tertiarybutylarsine, tertiarybutylphosphi
Chemical beam epitaxy growth of tensile-strained quantum well heterostructures for laser application
Publikováno v:
Journal of Crystal Growth. :1265-1269
We report on the chemical beam epitaxy growth conditions of high-quality Ga 1-x Al x As (x:0.2-0.6) and tensile-strained GaAs 1-y P y quantum wells (y: 0.05-0.29) on GaAs(0 0 1) surfaces using trimethylamine alane and alternative precursors of group
Publikováno v:
Journal of Applied Physics. 69:3297-3302
The growth rates of GaP and InP deposited by metalorganic molecular beam epitaxy using triethylgallium, trimethylindium, and precracked phosphine have been studied by reflection high energy electron diffraction and related to composition variations o
Publikováno v:
Applied Physics Letters. 74:3972-3974
Indium surface segregation during the growth of Ga1−xInxAs by chemical beam epitaxy is evidenced in real time by reflection high-energy electron diffraction. An efficient way to suppress the compositional broadening of GaAs on the GaInAs interface
Publikováno v:
Applied Physics Letters. 64:1371-1373
We have investigated the p‐type doping of GaInP grown by chemical beam epitaxy using bis‐cyclopentadienyl magnesium (Cp2Mg). Hole concentrations up to the 1018 cm−3 level have been achieved for substrate temperature as high as 550 °C and Mg in
Publikováno v:
Applied Physics Letters. 58:1973-1975
We report in this letter the sulfur doping of GaAs and Ga0.5In0.5P layers grown by metalorganic molecular beam epitaxy using a 1000 ppm hydrogen sulfide diluted in hydrogen dopant source. No precracking of H2S molecules is necessary to achieve effici
Publikováno v:
MRS Proceedings. 241
The low temperature growth procedure used in the case of GaAs to introduce high concentrations of deep traps such as arsenic antisite defects has been extended to the growth of InP by gas source molecular beam epitaxy. The low temperature growth of I