Zobrazeno 1 - 2
of 2
pro vyhledávání: '"J. C. Grande"'
Autor:
V. Tilak, Ed Kaminsky, A. P. Zhang, J. C. Grande, Julie Teetsov, Larry B. Rowland, A. Vertiatchikh, L.F. Eastman
Publikováno v:
Journal of Electronic Materials. 32:388-394
Device performance and defects in AlGaN/GaN high-electron mobility transistors (HEMTs) have been correlated. Surface depressions and threading dislocations, revealed by optical-defect mapping and atomic force microscopy (AFM), compromised the effecti
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c017015ec0ff4c3555115c1def054d4e
https://doi.org/10.1007/s11664-003-0163-6
https://doi.org/10.1007/s11664-003-0163-6
Publikováno v:
Journal of Animal Science. 94:252-252
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2f88e8642bd7325d0a3ff3c9b6b4db7c
https://doi.org/10.2527/jam2016-0526
https://doi.org/10.2527/jam2016-0526