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pro vyhledávání: '"J. Bisschop"'
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Akademický článek
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Autor:
M. von Tottleben, T. Bui, S.G.J. van Breda, C. Strijbos, I. de Jong, J. Bisschop, M. Schluck, M. van Leeuwen
Publikováno v:
Food Quality and Preference, 54, 13-22. ELSEVIER SCI LTD
Meat consumption-associated cancer risks relating to the preservative nitrate are receiving considerable attention. Consequently, innovative meat products are being developed with no or reduced nitrate levels. For example, phytochemicals are currentl
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::3eb2d45eec773f187492b3b853fa4813
https://doi.org/10.1016/j.foodqual.2016.06.014
https://doi.org/10.1016/j.foodqual.2016.06.014
Publikováno v:
IEEE transactions on nanotechnology, 15(2), 137-148. IEEE
IEEE Transactions on Nanotechnology
IEEE Transactions on Nanotechnology
A compact negative bias temperature instability (NBTI) model is presented by iteratively solving the RD equations in a simple way. The new compact model can handle arbitrary stress conditions without solving time-consuming equations, and is hence, su
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::abc729b97da9a4d03182dad4fcc08e25
https://research.utwente.nl/en/publications/c0c651be-21c0-4071-85ad-1308ff282d0c
https://research.utwente.nl/en/publications/c0c651be-21c0-4071-85ad-1308ff282d0c
Publikováno v:
2016 IEEE International Integrated Reliability Workshop (IIRW).
This paper presents the long-term stability of integrated CMOS resistors in a 40nm technology node. Unsilicided polysilicon and diffusion resistors with two different geometries were investigated. The thermal stability of the resistors was studied at
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6a6ebb7f8e6efe4ba988f4d5c18c0344
https://doi.org/10.1109/iirw.2016.7904904
https://doi.org/10.1109/iirw.2016.7904904
Autor:
Mohammad E. Barbati, Johannes Kalder, A.G. Peppelenbosch, Barend Mees, Geert Willem H. Schurink, Paula R. Keschenau, Alexander Gombert, J. Bisschop, Michael J. Jacobs, Drosos Kotelis, Jochen Grommes
Publikováno v:
Journal of Vascular Surgery. 66:1913-1914
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5ea430ee0227b5092c1bda9c8b832e5e
https://doi.org/10.1016/j.jvs.2017.10.005
https://doi.org/10.1016/j.jvs.2017.10.005
Publikováno v:
IEEE Transactions on Electron Devices. 58:2721-2728
In this paper, we develop a method to derive degradation formulas for time-varying stress from the formulas for the constant-bias case, discuss its limitations, and apply it to a set of radio-frequency (RF) stress experiments. First, we will give a n
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7dc16b45816e8811de47a09d565bc8e4
https://doi.org/10.1109/ted.2011.2153854
https://doi.org/10.1109/ted.2011.2153854
Publikováno v:
Microelectronics Reliability. 50:1210-1214
Voltage screen is a method to screen out products that suffer from defectivity related issues. A risk associated with voltage screen is that the applied voltage is too severe and damages the product. Most papers dealing with voltage screen determine
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4ca6eed588193b50c0b9a3a27fff79ae
https://doi.org/10.1016/j.microrel.2010.07.103
https://doi.org/10.1016/j.microrel.2010.07.103
Autor:
J. Bisschop
Publikováno v:
Microelectronics Reliability. 47:1330-1335
This tutorial focuses on three aspects of standardization: existing standards and organizations, evolution of standards and creation of new standards, new developments. An overview of existing standards and involved organizations is given. The main s
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::66d44053200916b763b3353b5bd67f85
https://doi.org/10.1016/j.microrel.2007.07.084
https://doi.org/10.1016/j.microrel.2007.07.084
Publikováno v:
Journal of Structural Geology. 27:943-947
Quartz single crystals were deformed by brittle processes in a diamond anvil cell at high confining pressure (800–1200 MPa) and room temperature in the presence of water.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fa842d5f9fa7037415b6f3173c114752
https://doi.org/10.1016/j.jsg.2005.03.001
https://doi.org/10.1016/j.jsg.2005.03.001