Zobrazeno 1 - 5
of 5
pro vyhledávání: '"J. A. Mandelman"'
Publikováno v:
Journal of fish biology. 90(5)
This study sought to observe the effects of submerged weight and frontal cross-sectional area of external telemetry packages on the kinematics, activity levels and swimming performance of small-bodied juvenile sharks, using lemon sharks Negaprion bre
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=pmid________::374e2ead220a255fb12277fcb49ef33f
https://pubmed.ncbi.nlm.nih.gov/28239865
https://pubmed.ncbi.nlm.nih.gov/28239865
Autor:
F. Odeh, Massimo V. Fischetti, Giorgio Baccarani, Antonio Gnudi, Woo-Hyeong Lee, J. A. Mandelman, Steven E. Laux, E. F. Crabbé, M. R. Wordeman, J.M.C. Stork
Publikováno v:
Scopus-Elsevier
Numerical modeling of the electrical behavior of semiconductor devices is playing an increasingly important role in their development. Examples that pertain to advanced MOSFETs and bipolar transistors are presented to illustrate the importance of tak
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::3bddde5ae58b2cce0443bbbd2799d6e8
https://doi.org/10.1147/rd.362.0208
https://doi.org/10.1147/rd.362.0208
Autor:
E.M. Buturla, D.P. Foty, Massimo V. Fischetti, J.B. Johnson, Stephen S. Furkay, James A. Slinkman, Steven E. Laux, K. Varahramyan, J. A. Mandelman, A.W. Strong, T.D. Linton, Daniel C. Cole, Orest Bula, F. Pileggi, D. Katcoff, J.W. Park, H.G. Lustig, P.E. Cottrell
Publikováno v:
Solid-State Electronics. 33:591-623
An overview is presented on the types of problems encountered in semiconductor technology development that are actively studied today via simulation methods. Most of the simulation examples presented here are ones that have been explicitly used in ac
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5a5597bca7ea246fe176fe6ddc51428a
https://doi.org/10.1016/0038-1101(90)90173-c
https://doi.org/10.1016/0038-1101(90)90173-c
Publikováno v:
Applied Physics Letters. 68:2843-2845
The maximum stress induced by high pressure oxidation (wet and dry) in the vertical bird’s beak of submicron trench structures has been investigated experimentally. The oxidation induced stress was measured via wafer bow on wafers that were pattern
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e408bbcd933b1dd1670d9c92325517d4
https://doi.org/10.1063/1.116343
https://doi.org/10.1063/1.116343
Autor:
J C, Mandelman, M J, DeCarlo
Publikováno v:
Provider (Washington, D.C.). 15(10)
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=pmid________::9b2cd989e00d81bc554366ec39e59ee6
https://pubmed.ncbi.nlm.nih.gov/10295725
https://pubmed.ncbi.nlm.nih.gov/10295725