Zobrazeno 1 - 4
of 4
pro vyhledávání: '"J. A. Coath"'
Publikováno v:
Journal of Physics: Condensed Matter. 12:4433-4450
The optical constants have been determined for films of CdSxTe1-x over the wavelength range 250-3200 nm. The films were prepared by vacuum evaporation from solid solutions. Rutherford backscattering spectrometry has been employed to determine the thi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ac06fb9848c15e29ac9ade421bbcdeb6
https://doi.org/10.1088/0953-8984/12/19/312
https://doi.org/10.1088/0953-8984/12/19/312
Publikováno v:
Journal of Electronic Materials. 28:1403-1408
Thin films of CdSxTe1−x (0≤x≤ 1) have been prepared by vacuum evaporation from solid solutions. Rutherford backscattering spectrometry has been used to determine the thickness of the films, which is in the range 8–50 nm, and x-ray diffraction
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9b8fc92f02f4c060f0c0b9f3ba3e697f
https://doi.org/10.1007/s11664-999-0130-y
https://doi.org/10.1007/s11664-999-0130-y
Publikováno v:
Thin Solid Films. 221:262-266
Tin oxide films have been grown by thermal evaporation of SnO 2 powder from a resistively heated alumina crucible. Analysis by X-ray diffraction and Rutherfold backscattering spectrometry has shown that the films are of an amorphous nature, with a ty
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::22b524c6c8c725b67c23c46c2de8de4b
https://doi.org/10.1016/0040-6090(92)90824-u
https://doi.org/10.1016/0040-6090(92)90824-u
Publikováno v:
Journal of Applied Physics. 70:1412-1415
The growth of VO2 and V2O3 thin films by reactive sputtering has been investigated. Previously reported studies of such thin films have often presented ambiguous results concerning the precise nature of the layers produced. A thorough and comprehensi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e52c9ace072da51208333b08563e95a6
https://doi.org/10.1063/1.349550
https://doi.org/10.1063/1.349550