Zobrazeno 1 - 10
of 70
pro vyhledávání: '"J.‐K. Zuo"'
Autor:
A.R. Atwell, J.-K. Zuo
Publikováno v:
Surface Science. 417:261-267
Scanning tunneling microscopy is used to determine the atomic geometry, electronic structure, charge state, chemical bonding and preferential adsorption of Cu initial growth on the Si(111)-(7×7) surface at room temperature. Results show that Cu atom
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5142f7bdb47d1d9f56469331c0ae8178
https://doi.org/10.1016/s0039-6028(98)00655-4
https://doi.org/10.1016/s0039-6028(98)00655-4
Autor:
J.-K. Zuo, J. F. Wendelken
Publikováno v:
Physical Review B. 56:3897-3902
Kinetic processes in the transition from metastable Ag(111) crystallites to ({radical}(3){times}{radical}(3))R30{degree} domains in the initial growth of Ag on the Si(111)-(7{times}7) surface have been investigated using spot profile analysis low-ene
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9dd5cf8af0cb2d97862ded4202f31173
https://doi.org/10.1103/physrevb.56.3897
https://doi.org/10.1103/physrevb.56.3897
Autor:
J. F. Wendelken, J.-K. Zuo
Publikováno v:
Physical Review Letters. 78:2791-2794
Evolution of mound morphology in reversible homoepitaxy on Cu(100) was studied via spot-profile-analysis (SPA) LEED and scanning tunneling microscopy. The mound separation shows coarsening vs growth time with L(t){approximately}t{sup 1/4}, in support
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::99da14270e65f9aa003f46425ed86734
https://doi.org/10.1103/physrevlett.78.2791
https://doi.org/10.1103/physrevlett.78.2791
Publikováno v:
Surface Science. 328:L527-L532
Island morphologies and island separations were determined from the two-dimensional diffraction patterns measured with high-resolution low-energy electron diffraction during sub-monolayer homoepitaxy on the Cu(001) surface. In the temperature range c
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a854525d305e05ae82bcbfb744cbe644
https://doi.org/10.1016/0039-6028(95)00087-9
https://doi.org/10.1016/0039-6028(95)00087-9
Publikováno v:
Surface Science. 301:233-244
A simple model is established to describe diffraction phenomena (LEED) from a unidirectionally reconstructed TaC(110) surface. By comparing diffraction data with results of detailed simulations, the reconstruction is found to consist of alternate (10
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e30e86d6de2dcfaf10e5da579e404f11
https://doi.org/10.1016/0039-6028(94)91303-x
https://doi.org/10.1016/0039-6028(94)91303-x
Autor:
J. F. Wendelken, J.-K. Zuo
Publikováno v:
Physical Review Letters. 70:1662-1665
The smoothing kinetics of a rough surface have been studied using time-resolved high resolution low energy electron diffraction. By depositing [similar to]100 monolayers of Cu on Cu(100) near room temperature, a rough surface results with an initial
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b5511f87fdf2982157790f2d4245e522
https://doi.org/10.1103/physrevlett.70.1662
https://doi.org/10.1103/physrevlett.70.1662
Autor:
D. M. Zehner, J.-K. Zuo
Publikováno v:
Physical Review B. 46:16122-16127
The geometric structure of the TaC(310) surface has been investigated using high-resolution low-energy electron diffraction. An ideally truncated TaC(310) surface has a staircase geometry where each unit consists of a (100) terrace, three row spacing
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::07af7479201a3b267ad31dd5e5931837
https://doi.org/10.1103/physrevb.46.16122
https://doi.org/10.1103/physrevb.46.16122
Publikováno v:
Surface Science. 254:21-28
Using the unique capability of the high-resolution LEED, we can precisely measure the Bragg peak positions and angular profiles of electron diffraction beams scattered from a crystal surface. The observations reported here relate to a reconstructed P
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a491c61b6a1940bc7fa1a808f4aff83f
https://doi.org/10.1016/0039-6028(91)90634-5
https://doi.org/10.1016/0039-6028(91)90634-5
Autor:
J. F. Wendelken, J.‐K. Zuo
Publikováno v:
Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films. 9:1539-1544
Step and impurity effects on the initial growth of a thin film have been demonstrated in the ( 7/8 × 7/8 )R30° (or simply 7/8 ) domain growth of Ag on Si(111) using high angular resolution low‐energy electron diffraction. Anisotropy in the 7/8 do
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c3ab51b3778969f80ea8552ce5cf0012
https://doi.org/10.1116/1.577658
https://doi.org/10.1116/1.577658
Autor:
John F. Wendelken, J.-K. Zuo
Publikováno v:
Physical Review Letters. 66:2227-2230
The evolution of the (\ensuremath{\surd}3 \ifmmode\times\else\texttimes\fi{} \ensuremath{\surd}3 )R30\ifmmode^\circ\else\textdegree\fi{} domain-size distribution with coverage for Ag on Si(111) has been studied by high-resolution low-energy electron
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4a2b1fc8ea0f802e9e26b7ca130e9b93
https://doi.org/10.1103/physrevlett.66.2227
https://doi.org/10.1103/physrevlett.66.2227