Výsledky vyhledávání - "J-M. Vinassa"

Lithium-ion battery SoH estimation based on incremental capacity peak tracking at several current levels for online application

Autor: Jean-Yves Deletage, M. Maures, J.-M. Vinassa, Olivier Briat, A. Capitaine

Publikováno v: Microelectronics Reliability
Microelectronics Reliability, Elsevier, 2020, 114, pp.113798-. ⟨10.1016/j.microrel.2020.113798⟩

In this paper, an extension to high C-rates of State of Health (SoH) diagnostic methods based on Incremental Capacity (IC) peak tracking is proposed. A set of eleven NCA Lithium-ion batteries who went under different ageing protocol is used. Charge a

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4e205bd135cd2dd86742ee1fba57354f
https://hal.archives-ouvertes.fr/hal-03493060

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Investigation of critical parameters in power supplies components failure due to electric pulse

Autor: L. Curos, Tristan Dubois, Bernard Plano, J.-M. Vinassa, F. Puybaret, G. Mejecaze

Publikováno v: Microelectronics Reliability
Microelectronics Reliability, Elsevier, 2020, 114, pp.113936-. ⟨10.1016/j.microrel.2020.113936⟩

This paper presents an investigation aiming to determine the thresholds that lead to the destruction of power supplies components, such as rectifier bridge and rectifier diode, under differential mode electric pulse injection in the case of High Elec

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::cfa69b536061a246939be93c9fa863f9
https://hal.archives-ouvertes.fr/hal-03493510

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Susceptibility Modelling of Flyback SMPS Transformer Input Stage Under High Current Pulse Injection

Autor: Tristan Dubois, F. Puybaret, G. Mejecaze, L. Curos, J.-M. Vinassa

Publikováno v: 2020 International Symposium on Electromagnetic Compatibility - EMC EUROPE.

This paper presents a model able to reproduce the behavior of the input stage of a switch-mode power supply (SMPS) under a high-level current pulse injected at its input in differential mode. Such high-level currents induce particular phenomena that

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::9b0a144f31123fd67a6ab6b8fa35d241
https://doi.org/10.1109/emceurope48519.2020.9245799

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Destruction analyses of power supplies due to electric pulse

Autor: F. Puybaret, L. Curos, G. Mejecaze, Tristan Dubois, J.-M. Vinassa

Publikováno v: Microelectronics Reliability
Microelectronics Reliability, Elsevier, 2019, 100, pp.113470-. ⟨10.1016/j.microrel.2019.113470⟩
Microelectronics Reliability, 2019, 100-101, pp.113470-. ⟨10.1016/j.microrel.2019.113470⟩

International audience; This paper presents the effects of high amplitude conducted electromagnetic pulses on the electrical behaviour of a flyback switch-mode power supply. The electromagnetic pulse is injected using a Current Injection Platform (PI

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::642b050e9c9d21a8c44900c82d7b7580
https://hal.archives-ouvertes.fr/hal-03488481/file/S0026271419304342.pdf

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Common Mode Modelling of a Current Injection Source for Susceptibility Study

Autor: F. Puybaret, G. Mejecaze, Tristan Dubois, J.-M. Vinassa

Publikováno v: Proceedings of EMC Europe, 2018
Proceedings of EMC Europe, 2018, 2018, Amsterdam, Netherlands

This article deals with the modelling of a high current injection source associated with its electrical generation-transformation-distribution chain, its coupling way and all wires. This complex installation has been modelled for common mode inj ecti

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::038f9927f98d0f8b4ad8478afa58c660
https://hal.archives-ouvertes.fr/hal-02516475

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