Zobrazeno 1 - 10
of 10
pro vyhledávání: '"J Tijn van Omme"'
Autor:
James L. Hart, Kanit Hantanasirisakul, Andrew C. Lang, Babak Anasori, David Pinto, Yevheniy Pivak, J. Tijn van Omme, Steven J. May, Yury Gogotsi, Mitra L. Taheri
Publikováno v:
Nature Communications, Vol 10, Iss 1, Pp 1-10 (2019)
Two-dimensional transition metal carbides and nitrides (MXenes) have emerged as highly conductive and stable materials, of promise for electronic applications. Here, the authors use in situ electric biasing and transmission electron microscopy to inv
Externí odkaz:
https://doaj.org/article/b77dfca2e62d4dc198dec064950223d7
Autor:
Ningyan Cheng, Hongyu Sun, Anne France Beker, J Tijn van Omme, Emil Svensson, Hamidreza Arandiyan, Hye Ryoung Lee, Binghui Ge, Shibabrata Basak, Rüdiger A Eichel, Yevheniy Pivak, Qiang Xu, H Hugo Pérez Garza, Zongping Shao
Publikováno v:
Nanotechnology 33(44), 445702 (2022). doi:10.1088/1361-6528/ac83c7
Liquid phase transmission electron microscopy (TEM) provides a useful means to study a wide range of dynamics in solution with near-atomic spatial resolution and sub-microsecond temporal resolution. However, it is still a challenge to control the che
Autor:
J. Tijn van Omme, Hanglong Wu, Hongyu Sun, Anne France Beker, Mathilde Lemang, Ronald G. Spruit, Sai P. Maddala, Alexander Rakowski, Heiner Friedrich, Joseph P. Patterson, H. Hugo Pérez Garza
Publikováno v:
Journal of Materials Chemistry C, 8(31), 10781-10790. Royal Society of Chemistry
Journal of Materials Chemistry C
Journal of Materials Chemistry C
Liquid phase transmission electron microscopy has become a powerful tool for imaging the structure and dynamics of materials in solution. Direct observation of material formation, modification and operation has provided unique insights into the chemi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::06df67b75cc2ecd30eb0f65d77d09209
https://research.tue.nl/nl/publications/40718fe9-b1c0-4474-b258-7a9e241facc7
https://research.tue.nl/nl/publications/40718fe9-b1c0-4474-b258-7a9e241facc7
Autor:
Anne France Beker, Hongyu Sun, Mathilde Lemang, J. Tijn van Omme, Ronald G. Spruit, Marien Bremmer, Shibabrata Basak, H. Hugo Pérez Garza
Publikováno v:
Nanoscale 12(43), 22192-22201 (2020). doi:10.1039/D0NR04961A
The field of electrochemistry promises solutions for the future energy crisis and environmental deterioration by developing optimized batteries, fuel-cells and catalysts. Combined with in situ transmission electron microscopy (TEM), it can reveal fun
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::6e75acc92f4a3cbb0fc86cc8d1258169
https://hdl.handle.net/2128/27034
https://hdl.handle.net/2128/27034
Autor:
Ronald G. Spruit, Hector Hugo Perez Garza, J. Tijn van Omme, Marina Zakhozheva, Mariya Sholkina
Publikováno v:
Ultramicroscopy. 192:14-20
In this work we present our advanced in situ heating sample carrier for transmission electron microscopy (TEM). The TEM is a powerful tool for materials characterization, especially when combined with micro electro-mechanical systems (MEMS). These de
Publikováno v:
Journal of Microelectromechanical Systems. 26:1165-1182
Microelectromechanical systems (MEMS)-based sample carriers became a breakthrough for in situ inspection techniques, especially in transmission electron microscopy where the sample carrier functions as a microsized laboratory and enables dynamic stud
Autor:
Mitra L. Taheri, David Pinto, Babak Anasori, Andrew C. Lang, Yury Gogotsi, Kanit Hantanasirisakul, Steven J. May, Yevheniy Pivak, James L. Hart, J. Tijn van Omme
Publikováno v:
Nature Communications
Nature Communications, Vol 10, Iss 1, Pp 1-10 (2019)
Nature Communications, Vol 10, Iss 1, Pp 1-10 (2019)
MXenes are an emerging family of highly-conductive 2D materials which have demonstrated state-of-the-art performance in electromagnetic interference shielding, chemical sensing, and energy storage. To further improve performance, there is a need to i
Autor:
Leopoldo Molina Luna, Ronald G. Spruit, Qiang Xu, Merijn Pen, Mariya Sholkina, Yevheniy Pivak, Hector Hugo Perez Garza, J. Tijn van Omme
Publikováno v:
2017 19th International Conference on Solid-State Sensors, Actuators and Microsystems (TRANSDUCERS).
We present the development of a MEMS-based sample carrier to be used for in-situ studies inside the Transmission Electron Microscope (TEM). This MEMS device, referred to as the Nano-Chip, acts as a multifunctional sample carrier and micro-sized labor
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