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pro vyhledávání: '"J M, Trujillo"'
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Autor:
Sergio Bonaque-González, David Carmona-Ballester, J. M. Trujillo-Sevilla, Alicia Pareja-Ríos, Matt T. Jaskulski
Publikováno v:
Journal of Optometry
Purpose to evaluate the effects of kappa angle and intraocular orientation on the theoretical performance of asymmetric multifocal intraocular lenses (MIOL). Methods For a total of 21 corneal aberrations, a computational analysis simulated the implan
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::4b33aee511233f080e88f44b19449991
https://doi.org/10.1016/j.optom.2020.07.004
https://doi.org/10.1016/j.optom.2020.07.004
Autor:
Miriam Velasco-Ocaña, Javier Martín-Hernández, J. M. Trujillo-Sevilla, Álvaro Pérez-García, Alex Roqué-Velasco, Oscar Casanova-González, José Manuel Ramos, Óscar Gómez-Cárdenes, Sabato Ceruso, Jan O. Gaudestad, Ricardo Oliva-García
Publikováno v:
International Conference on Extreme Ultraviolet Lithography 2021.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::53665a2e295c485022de74b72932e7cc
https://doi.org/10.1117/12.2605516
https://doi.org/10.1117/12.2605516
Autor:
Sergio Bonaque-González, Ceruso S, Roqué-Velasco A, J. M. Rodríguez-Ramos, Jack T. Holladay, J. M. Trujillo-Sevilla, Oscar Casanova-González, Sicilia-Cabrera M, Velasco-Ocaña M, Gomez-Cardenes O, Gatinel D, J. G. Marichal-Hernandez, Martín-Hernández J, Oliva-García R
Ocular optics is normally estimated based on 2,600 measurement points within the pupil of the eye, which implies a lateral resolution of approximately 175 microns for a 9 mm pupil diameter. This is because information below this resolution is not tho
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f1fc770d26ccc70b2ad5c72fc1936c47
https://doi.org/10.1101/2021.02.26.20241604
https://doi.org/10.1101/2021.02.26.20241604
Autor:
Sergio Bonaque-González, Oscar Casanova-González, Jack T. Holladay, Sabato Ceruso, Óscar Gómez-Cárdenes, Damien Gatinel, J. G. Marichal-Hernandez, J. M. Trujillo-Sevilla, Javier Martín-Hernández, Miriam Velasco-Ocaña, Ricardo Oliva-García, Alex Roqué-Velasco, Miguel Jesús Sicilia-Cabrera, José Manuel Rodríguez-Ramos
Publikováno v:
Scientific Reports
Scientific Reports, Vol 11, Iss 1, Pp 1-12 (2021)
Scientific Reports, Vol 11, Iss 1, Pp 1-12 (2021)
Ocular optics is normally estimated based on up to 2,600 measurement points within the pupil of the eye, which implies a lateral resolution of approximately 175 µm for a 9 mm pupil diameter. This is because information below this resolution is not t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::eb587e19fac5ea76ff37f87095b63205
https://pubmed.ncbi.nlm.nih.gov/34857820
https://pubmed.ncbi.nlm.nih.gov/34857820
Publikováno v:
2020 31st Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC).
In this paper we introduce a new metrology technique for measuring wafer geometry on silicon wafers. Wave Front Phase Imaging (WFPI) has high lateral resolution and is sensitive enough to measure roughness on a silicon wafer by simply acquiring a sin
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5f662b40dc2bcbe0919ec9b70ba68df8
https://doi.org/10.1109/asmc49169.2020.9185222
https://doi.org/10.1109/asmc49169.2020.9185222
Publikováno v:
Metrology, Inspection, and Process Control for Microlithography XXXIV.
In this paper we introduce a new metrology technique for measuring wafer geometry on silicon wafers. Wave Front Phase Imaging (WFPI) has high lateral resolution and is sensitive enough to measure roughness on a silicon wafer by simply acquiring a sin
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5e75f9e8df3da868b3089e728c586c58
https://doi.org/10.1117/12.2547406
https://doi.org/10.1117/12.2547406
Publikováno v:
Photonic Instrumentation Engineering VII.
In this paper we show that Wave Front Phase Imaging (WFPI) has high lateral resolution and high sensitivity enabling it to measure nanotopography and roughness on a silicon wafer by simply acquiring a single image of the entire wafer. WFPI is achieve
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::54c25fbc3afe868db5573c2dccff640b
https://doi.org/10.1117/12.2547405
https://doi.org/10.1117/12.2547405
Autor:
Sabato Ceruso, Jan O. Gaudestad, Miguel Jesús Sicilia-Cabrera, J. M. Trujillo-Sevilla, Jose-Manuel Rodríguez-Ramos, David Carmona-Ballester, Oscar Casanova-González, Sergio Bonaque-González
Publikováno v:
Ophthalmic Technologies XXX.
We present a new wave front sensing technique based on detecting the propagating light waves. This allows the user to acquire millions of data points within the pupil of the human eye; a resolution several orders of magnitude higher than current indu
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::96b34c0227b40e6adf54804df9121c2e
https://doi.org/10.1117/12.2548595
https://doi.org/10.1117/12.2548595
Publikováno v:
2019 International Wafer Level Packaging Conference (IWLPC).
In this paper we show that Wave Front Phase Imaging (WFPI) has good enough lateral resolution and is sensitive enough to measure roughness on a silicon wafer by simply acquiring a simple image of the entire wafer. WFPI is achieved by measuring the re
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3b93b68ff6aa8692dcb07db0ba1746e2
https://doi.org/10.23919/iwlpc.2019.8914114
https://doi.org/10.23919/iwlpc.2019.8914114