Zobrazeno 1 - 10
of 42
pro vyhledávání: '"J M, Anthony"'
Publikováno v:
Journal of Electronic Materials. 30:1527-1531
Low-K dielectric films have reduced hardness and modulus relative to traditional dielectric materials. There are many potential challenges associated with these materials to integrate with integrated circuit (IC) technologies. It is important to eval
Publikováno v:
Journal of Applied Physics. 89:5243-5275
Many materials systems are currently under consideration as potential replacements for SiO2 as the gate dielectric material for sub-0.1 μm complementary metal–oxide–semiconductor (CMOS) technology. A systematic consideration of the required prop
Publikováno v:
Integrated Ferroelectrics. 21:355-366
The deposition temperature dependence of Ba0.7Sr0.3TiO3 (BST) thin film physical and electrical properties was investigated. Films were deposited between 250 and 500°C by electron cyclotron resonance (ECR) plasmaenhanced liquid source metalorganic c
Autor:
S. F. Hicks, B. T. Meehan, B. M. Haas, C. M. Davoren, J. M. Anthony, B. H. Benedict, C. L. Lundstedt, J. R. Vanhoy
Publikováno v:
Physical Review C. 52:2387-2400
The excited levels of {sup 142}Ce have been studied using the ({ital n},{ital n}{sup {prime}}{gamma}) reaction. Excitation functions, angular distributions, and Doppler shifts were measured for {gamma} rays from levels up to an excitation energy of 3
Publikováno v:
Veterinary and comparative oncology. 11(2)
The objective of this study was to develop a clinically applicable technique to visualize the medial retropharyngeal, superficial cervical, axillary, superficial inguinal and medial iliac lymph nodes on radiographs. Direct and indirect lymphangiograp
Autor:
D. H. Lee, J. M. Sanders, J. M. Anthony, James H. McGuire, Patrick Richard, Y. D. Wang, Theo J. M. Zouros
Publikováno v:
Physical Review A. 46:1374-1387
Cross sections for 1s ionization of the 1s 2 2s 2 and 1s 2 2s2p 3 P (metastable) states of C 2+ and O 4+ ions in 0.5-1.8 MeV/u collisions with H 2 and He targets were measured using projectile Auger electron spectroscopy at 0 o
Autor:
H. D. Shih, A. Vigliante, T. D. Golding, J. M. Anthony, J. T. Zborowski, P. C. Chow, W. C. Fan
Publikováno v:
Journal of Applied Physics. 71:5908-5912
We have used the technique of molecular beam epitaxy to grow InAs on GaSb, GaSb on InAs, and InAs/InxGa1−xSb (0≤x≤0.4) multilayered structures and have performed a detailed investigation of the layers and resultant interfaces. The structures we
Autor:
J. M. Anthony Danby
Publikováno v:
The American Mathematical Monthly. 104:675-677
Publikováno v:
Applied Physics Letters. 63:3291-3293
Using a thin predeposited B layer prior to the epitaxial growth of Ge on CaF2, we have obtained significantly improved Ge crystalline quality and surface morphology for Ge/CaF2/Si(111) and Ge/CaF2/Si(100) structures. Although B acts as a surfactant i