Zobrazeno 1 - 10
of 266
pro vyhledávání: '"Jürgen, Mohr"'
Publikováno v:
Applied Sciences, Vol 11, Iss 16, p 7234 (2021)
X-ray full-field microscopy at laboratory sources for photon energies above 10 keV suffers from either long exposure times or low resolution. The photon flux is mainly limited by the objectives used, having a limited numerical aperture NA. We show th
Externí odkaz:
https://doaj.org/article/2fecff9db4b846d389aab25a9d2d47e8
Autor:
Margarita Zakharova, Vitor Vlnieska, Heike Fornasier, Martin Börner, Tomy dos Santos Rolo, Jürgen Mohr, Danays Kunka
Publikováno v:
Applied Sciences, Vol 8, Iss 3, p 468 (2018)
Single-shot grating-based phase-contrast imaging techniques offer additional contrast modalities based on the refraction and scattering of X-rays in a robust and versatile configuration. The utilization of a single optical element is possible in such
Externí odkaz:
https://doaj.org/article/3f359e9a37694d568c3f0cffc01f19a7
Publikováno v:
Applied Sciences, Vol 8, Iss 4, p 528 (2018)
The quality of high aspect ratio microstructures fabricated by deep X-ray lithography is highly dependent on the photoresist material used and the process parameters applied. Even with photoresists more suitable to this process, it is common to face
Externí odkaz:
https://doaj.org/article/dd9412291ada4e4aa964ac9f62813bcb
Autor:
Maria Seifert, Jürgen Mohr, Pascal Meyer, Jens Rieger, Gisela Anton, Sebastian Kaeppler, Georg Pelzer, Daniel Sand, Florian Horn, Veronika Ludwig, Christian Riess, Thilo Michel
Publikováno v:
Scientific Reports, Vol 9, Iss 1, Pp 1-11 (2019)
Scientific reports, 9 (1), Article no: 4199
Scientific Reports
Scientific reports, 9 (1), Article no: 4199
Scientific Reports
Compared to conventional attenuation x-ray radiographic imaging, the x-ray Talbot-Lau technique provides further information about the scattering and the refractive properties of the object in the beam path. Hence, this additional information should
Autor:
Torben Haugaard Jensen, Martin Bech, Tina Binderup, Arvid Böttiger, Christian David, Timm Weitkamp, Irene Zanette, Elena Reznikova, Jürgen Mohr, Fritz Rank, Robert Feidenhans'l, Andreas Kjær, Liselotte Højgaard, Franz Pfeiffer
Publikováno v:
PLoS ONE, Vol 8, Iss 1, p e54047 (2013)
Invasive cancer causes a change in density in the affected tissue, which can be visualized by x-ray phase-contrast tomography. However, the diagnostic value of this method has so far not been investigated in detail. Therefore, the purpose of this stu
Externí odkaz:
https://doaj.org/article/08fdc81622a542b4af821095883909f7
Publikováno v:
International Journal of Technology Management. 90:267
Publikováno v:
Microsystem Technologies. 25:2975-2983
Deep X-ray lithography is a preferred fabrication approach for those micro devices that depend on smooth and vertical sidewalls of comparatively deep structures rather than extreme lateral resolution. The structure quality obtained depends on, and is
Autor:
Martin Börner, David M. Klymyshyn, Markus Guttmann, Jürgen Mohr, A.A. Qureshi, Marc Schneider, Waqas Mazhar
Publikováno v:
Microsystem Technologies. 24:3893-3900
In this article, application of micro-replication of polymers in the field of next generation mm-wave antennas is presented for the first time. The concept is applied to recently proposed template-based dielectric resonator antenna arrays fabricated
Publikováno v:
IEEE Transactions on Antennas and Propagation. 65:4576-4584
An approach suitable for millimeter-wave dielectric resonator antenna (DRA) arrays is presented. The methodology involves fabricating precise cavities in acrylic templates and filling them with composite dielectric materials to create a monolithic po
Autor:
Tobias J. Schröter, Alexander A. Fingerle, Thomas Pralow, Nataly Wieberneit, Martin Renz, Hanns-Ingo Maack, M. F. Reiser, H. van der Heijden, Kai Scherer, Fabian Kriner, Christian Braun, Felix K. Kopp, Ernst J. Rummeny, Bernhard Gleich, Julia Herzen, F de Marco, Katharina Hellbach, Roland Proksa, Peter B. Noël, Konstantin Willer, Andre Yaroshenko, Daniela Münzel, Florian Fischer, Jürgen Mohr, Thomas Koehler, Sigrid Auweter, Karsten Rindt, Franz Pfeiffer, Klaus Achterhold, Bernhard Renger, Lukas B. Gromann
Publikováno v:
RöFo - Fortschritte auf dem Gebiet der Röntgenstrahlen und der bildgebenden Verfahren. 189:S1-S124