Zobrazeno 1 - 10
of 26
pro vyhledávání: '"Jörg Berthold"'
Autor:
Jennifer Schauer, Sören G Gatermann, Jessica Eisfeld, Jörg Berthold Hans, Stefan Ziesing, Dirk Schlüter, Niels Pfennigwerth
Publikováno v:
Journal of Antimicrobial Chemotherapy. 77:1247-1253
Objectives To identify novel carbapenem resistance mechanisms and their potential to spread among clinical isolates. Methods Four clinical isolates of Citrobacter freundii, Serratia marcescens and Raoultella planticola (n = 2) from one hospital in Ce
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::fae56511ea7a833df154076e59551cad
https://doi.org/10.1093/jac/dkac050
https://doi.org/10.1093/jac/dkac050
Akademický článek
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Autor:
Schauer, Jennifer, Gatermann, Sören G, Eisfeld, Jessica, Hans, Jörg Berthold, Ziesing, Stefan, Schlüter, Dirk, Pfennigwerth, Niels
Publikováno v:
Journal of Antimicrobial Chemotherapy (JAC); May2022, Vol. 77 Issue 5, p1247-1253, 7p
Autor:
Andreas Martin, Christian Schlunder, Hans Reisinger, Fabian Proebster, Jörg Berthold, Wolfgang Gustin
Publikováno v:
Microelectronics Reliability. 64:179-184
BTI parameter degradation of MOSFETs shows a statistical variation. The distribution of the threshold voltage V th after NBTI stress originates from a convolution of the distribution of the virgin devices together with the additional distribution of
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6c7d3870f214605e97f98af5a941f5fd
https://doi.org/10.1016/j.microrel.2016.07.007
https://doi.org/10.1016/j.microrel.2016.07.007
Publikováno v:
Advances in Radio Science, Vol 3, Pp 311-317 (2005)
The use of multiple supply voltages to reduce active mode power dissipation in digital ULSI circuits has been widely discussed in literature. As the reported power savings differ significantly depending on the technology and level converter circuits
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e4f0fa385c53a5abea32662ced3ddacc
https://www.adv-radio-sci.net/3/311/2005/
https://www.adv-radio-sci.net/3/311/2005/
Publikováno v:
Advances in Radio Science, Vol 5, Pp 279-284 (2007)
A study, based on product related scenarios, on power supply integrity issues is conducted. The effectiveness of specific design parameters depends strongly on the expected loading of the power distribution grid. Therefore, the commonly used approach
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::466d03c974a2eb058614f35f72be6643
https://www.adv-radio-sci.net/5/279/2007/
https://www.adv-radio-sci.net/5/279/2007/
Autor:
Katja Puschkarsky, Christian Schlunder, Georg Georgakos, Fabian Proebster, Hans Reisinger, Jörg Berthold, Wolfgang Gustin
Publikováno v:
2017 IEEE International Reliability Physics Symposium (IRPS).
Hot carrier induced degradation of MOSFETs is still a concern for circuit reliability and not yet fully understood [1-4]. On the one hand stress measurements at single devices reveal critical parameter degradation for modern technologies especially a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5046f94713cc9fb46a3e7a787d66fa27
https://doi.org/10.1109/irps.2017.7936262
https://doi.org/10.1109/irps.2017.7936262
Autor:
Fabian Proebster, Hans Reisinger, Andreas Martin, Wolfgang Gustin, Christian Schlunder, Jörg Berthold
Publikováno v:
2017 IEEE International Reliability Physics Symposium (IRPS).
BTI parameter degradation of MOSFETs shows a statistical variation. The distribution of the threshold voltage Vth after NBTI stress originates from a convolution of the distribution of the virgin devices together with the additional distribution of t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::358347f385ceb406a89c30464748b177
https://doi.org/10.1109/irps.2017.7936270
https://doi.org/10.1109/irps.2017.7936270
Publikováno v:
Advances in Radio Science, Vol 6, Pp 227-232 (2008)
Based on product related scenarios, the impact of on-chip inductance on power supply integrity is analyzed. The impact of varying current profiles is shown to be minimal. In a regular power grid with regular bump connections, the impact of on-chip in
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::616039ee8a96ea1d84e68b1b2215129a
https://doi.org/10.5194/ars-6-227-2008
https://doi.org/10.5194/ars-6-227-2008
Autor:
T. Lueftner, R.J. Knight, K. Just, Doris Schmitt-Landsiedel, G. Sauzon, P. Acharya, Christian Pacha, P. Hober, A. Bonnardot, P. Mahrla, O. Hoemke, A. Yakovleff, M. Sauer, Jörg Berthold, S. Buch, Georg Georgakos, Stephan Henzler, A. Klein, J. Beshenar
Publikováno v:
ISSCC
To meet the widely varying speed and power requirements of multifunctional mobile devices, an appropriate combination of technology features, circuit-level low-power techniques, and system architecture is implemented in a GSM/Edge baseband processor
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::9685435b79cfee761896703aa9b1d534
https://doi.org/10.1109/jssc.2006.886528
https://doi.org/10.1109/jssc.2006.886528