Zobrazeno 1 - 10
of 97
pro vyhledávání: '"Jörg Maser"'
Autor:
Curt Preissner, Oliver Schmidt, Vincent De Andrade, Jonathan Knopp, Luca Rebuffi, Steven P. Kearney, Barry Lai, Jörg Maser, Si Chen, Ruben Reininger, Christian Roehrig, Deming Shu, Tim Mooney, Xianbo Shi
Publikováno v:
X-Ray Nanoimaging: Instruments and Methods V.
We will present the design for the In-Situ Nanoprobe (ISN) beamline that is being developed as part of the Upgrade of the APS storage ring with an MBA magnetic lattice. The ISN will provide large working distance of 60 mm for in-situ and operando env
Publikováno v:
Synchrotron Radiation News. 32:13-19
Nanofocusing of X-rays to ever smaller spot sizes requires increasingly stringent requirements for the stability of X-ray microscopes and X-ray nanoprobes. With X-ray optics now capable of focusing...
Autor:
Ray Conley, Juan Zhou, Xiaojing Huang, Nathalie Bouet, Yong S. Chu, Hanfei Yan, Albert T. Macrander, Evgeny Nazaretski, Jörg Maser
Publikováno v:
Journal of Nanoscience and Nanotechnology. 19:575-584
Diffraction optics fabricated from multilayers offer an intriguing alternative to lithography-based zone plates due to their advantages of virtually limitless aspect ratio and extremely small feature size. However, other issues, intrinsic to thin-fil
Autor:
Wonsuk Cha, Hayley Hirsh, Stephanie Matson, Ryan Bouck, Ying Shirley Meng, Jörg Maser, Oleg Gorobtsov, Minghao Zhang, Ross Harder, Ziyi Wang, Andrej Singer, Daniel Weinstock, Dina Sheyfer
Non-equilibrium defects often dictate macroscopic functional properties of materials. In intercalation hosts, widely used in rechargeable batteries, high-dimensional defects largely define reversibility and kinetics. However, transient defects briefl
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::60ac59f27ebdea35144d008bc25cd840
http://arxiv.org/abs/2106.12145
http://arxiv.org/abs/2106.12145
Publikováno v:
The Journal of Physical Chemistry C. 122:22897-22902
We investigate the kinetics of elemental segregation during the synthesis of Cu(In1−x,Gax)Se2 (CIGS) thin films via a rapid thermal growth process. Changes in elemental concentration are mapped rapidly via in situ X-ray fluorescence (XRF) microscop
Autor:
Kiran Sasikumar, Ross Harder, Daniel S. Schulmann, Andrew J. Arnold, Wonsuk Cha, Sridhar Sadasivam, Saptarshi Das, Subramanian K. R. S. Sankaranarayanan, Mathew J. Cherukara, Henry Chan, Jörg Maser
Publikováno v:
Nano Letters. 18:1993-2000
Emerging two-dimensional (2-D) materials such as transition-metal dichalcogenides show great promise as viable alternatives for semiconductor and optoelectronic devices that progress beyond silicon. Performance variability, reliability, and stochasti
Autor:
Mariana I. Bertoni, Bradley West, Tara Nietzold, Dmitry Poplavskyy, Jeff Bailey, Jörg Maser, Rouin Farshchi, Michael Stuckelberger, Barry Lai
Publikováno v:
IEEE Journal of Photovoltaics. 8:278-287
Unveiling the correlation among electrical performance, elemental distribution, and defects at the microscale is crucial for the understanding and improvement of the overall solar cell performance. While this is true in general for solar cells with p
Autor:
Barry Lai, Mariana I. Bertoni, Tara Nietzold, Volker Rose, Michael Stuckelberger, Jörg Maser, Bradley West
Publikováno v:
Journal of Materials Research. 32:1825-1854
In situ and operando measurement techniques combined with nanoscale resolution have proven invaluable in multiple fields of study. We argue that evaluating device performance as well as material behavior by correlative X-ray microscopy with
Autor:
Mariana I. Bertoni, Michael Stuckelberger, Lei Chen, Mowafak Al-Jassim, Harvey Guthrey, Volker Rose, Bradley West, Jörg Maser, William N. Shafarman, Barry Lai
Publikováno v:
Nano Energy. 32:488-493
Statistical and correlative analysis are increasingly important in the design and study of new materials, from semiconductors to metals. Non-destructive measurement techniques, with high spatial resolution, capable of correlating composition and/or s
Autor:
Deming Shu, Alex Deriy, Sunil Bean, Wenjun Liu, Kamel Fezzaa, Vincent De Andrade, Jonathan Z. Tischler, Jayson Anton, Steven P. Kearney, Barry Lai, Jörg Maser, Francesco De Carlo
Publikováno v:
X-Ray Nanoimaging: Instruments and Methods IV.
The Transmission X-ray Microscope (TXM) at beamline 32-ID-C of the Advanced Photon Source (APS) is a high throughput instrument with high spatial resolution for operando nano-tomography experiments [1]. Recently, a flexural nanopositioning stage syst