Zobrazeno 1 - 1
of 1
pro vyhledávání: '"Jägle, Eric Aimo"'
Atom probe tomography (APT) has matured to a versatile nanoanalytical characterization tool with applications that range from materials science to geology and possibly beyond. Already, well over 100 APT microscopes exist worldwide. Information from t
Externí odkaz:
http://arxiv.org/abs/2004.05188