Ultrahigh-Resolution, Label-Free Hyperlens Imaging in the Mid-IR.

Autor: He M; Department of Mechanical Engineering, Vanderbilt University, Nashville, Tennessee 37212, United States., Iyer GRS; ASEE/NRC Postdoctoral Fellow residing at NRL, Washington D.C. 20375, United States.; U.S. Naval Research Laboratory, Washington D.C. 20375, United States., Aarav S; Department of Electrical Engineering, Princeton University, Princeton, New Jersey 08544, United States., Sunku SS; Department of Physics, Columbia University, New York, New York 10027, United States., Giles AJ; U.S. Naval Research Laboratory, Washington D.C. 20375, United States., Folland TG; Department of Mechanical Engineering, Vanderbilt University, Nashville, Tennessee 37212, United States.; Department of Physics and Astronomy, The University of Iowa, Iowa City, Iowa 52242, United States., Sharac N; ASEE/NRC Postdoctoral Fellow residing at NRL, Washington D.C. 20375, United States., Sun X; Department of Electrical Engineering, Princeton University, Princeton, New Jersey 08544, United States., Matson J; Department of Mechanical Engineering, Vanderbilt University, Nashville, Tennessee 37212, United States., Liu S; Tim Taylor Department of Chemical Engineering, Kansas State University, Manhattan, Kansas 66506, United States., Edgar JH; Tim Taylor Department of Chemical Engineering, Kansas State University, Manhattan, Kansas 66506, United States., Fleischer JW; Department of Electrical Engineering, Princeton University, Princeton, New Jersey 08544, United States., Basov DN; Department of Physics, Columbia University, New York, New York 10027, United States., Caldwell JD; Department of Mechanical Engineering, Vanderbilt University, Nashville, Tennessee 37212, United States.

Publikováno v: Nano letters [Nano Lett] 2021 Oct 13; Vol. 21 (19), pp. 7921-7928. Date of Electronic Publication: 2021 Sep 17.