Experimental study of EUV mirror radiation damage resistance under long-term free-electron laser exposures below the single-shot damage threshold

Autor: Igor Alexandrovich Makhotkin, Jaromír Chalupský, Dorota Klinger, Ryszard Sobierajski, Libor Juha, Marek Jurek, Elke Plönjes, Iwanna Jacyna, Karel Saksl, Sebastian Strobel, Michael Störmer, Frank Siewert, Kai Tiedtke, Eric Louis, Barbara Keitel, Igor Milov, Věra Hájková, Tobias Mey, Laurent Nittler, R.A. Loch, Gosse de Vries, Sven Toleikis, Martin Hermann, Siegfried Schreiber, Y. Syryanyy, Tomáš Burian, Han Kwang Nienhuys, Hartmut Enkisch, Grzegorz Gwalt, Bart Faatz, V. Vozda, Robbert Wilhelmus Elisabeth van de Kruijs, Frank Scholze

Publikováno v: Journal of synchrotron radiation 25(1), 77-84 (2018). doi:10.1107/S1600577517017362
Journal of Synchrotron Radiation
Makhotkin, I.A.; Sobierajski, R.; Chalupský, J.; Tiedtke, K.; De Vries, G.; Störmer, M.; Scholze, F.; Siewert, F.; Van De Kruijs, R.W.E.; Milov, I.; Louis, E.; Jacyna, I.; Jurek, M.; Klinger, D.; Nittler, L.; Syryanyy, Y.; Juha, L.; Hájková, V.; Vozda, V.; Burian, T.; Saksl, K.; Faatz, B.; Keitel, B.; Plönjes, E.; Schreiber, S.; Toleikis, S.; Loch, R.; Hermann, M.; Strobel, S.; Nienhuys, H.-K.; Gwalt, G.; Mey, T.; Enkisch, H.: Experimental study of EUV mirror radiation damage resistance under long-term free-electron laser exposures below the single-shot damage threshold. In: Journal of Synchrotron Radiation. Vol. 25 (2018) 1, 77-84. (DOI: /10.1107/S1600577517017362)
Journal of synchrotron radiation, 25(1), 77-84. International Union of Crystallography

Journal of synchrotron radiation 25(1), 77 - 84 (2018). doi:10.1107/S1600577517017362
The durability of grazing- and normal-incidence optical coatings has been experimentally assessed under free-electron laser irradiation at various numbers of p

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::3db3625e434f17702e7c6f075fcc8a20
https://doi.org/10.1107/s1600577517017362

Determining the transmission of thin foil filters for soft X-ray free-electron laser radiation: an ablation imprint approach (Conference Presentation)

Autor: Dorota Klinger, Marek Jurek, Igor Alexandrovich Makhotkin, Karel Saksl, Michael Störmer, Jerzy B. Pelka, Eric Louis, Sven Toleikis, Vojtech Vozda, Marion Kuhlmann, Iwanna Jacyna, Tomáš Burian, Siegfried Schreiber, Sebastian Strobel, Jaromír Chalupský, Hartmut Enkisch, Mabel Ruiz-Lopez, Frank Siewert, Barbara Keitel, Thomas Wodzinski, Martin Hermann, Vera Hájková, R.A. Loch, Gosse de Vries, Libor Juha, Elke Plönjes, Kai Tiedtke, Tobias Mey, Ryszard Sobierajski, Frank Scholze

Publikováno v: Optics Damage and Materials Processing by EUV/X-ray Radiation VII.

An accurate transmission measurement of thin foils (usually made of elemental metals and/or semiconductors), which routinely are used as attenuators in soft x-ray beamlines, end-stations and instruments, represents a long standing problem over the wi

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::cbe59645973d80dc96a4a15de0687346
https://doi.org/10.1117/12.2524718

Mechanism of single-shot damage of Ru thin films irradiated by femtosecond extreme UV free-electron laser

Autor: Frank Siewert, Iwanna Jacyna, Jaromír Chalupský, Robbert Wilhelmus Elisabeth van de Kruijs, Nikita Medvedev, Ryszard Sobierajski, Elke Plönjes, Igor Alexandrovich Makhotkin, Fred Bijkerk, Barbara Keitel, R.A. Loch, Gosse de Vries, V. Vozda, Bart Faatz, Han-Kwang Nienhuys, Tomáš Burian, Grzegorz Gwalt, Igor Milov, Tobias Mey, Eric Louis, Siegfried Schreiber, Sebastian Strobel, Martin Hermann, Michael Störmer, Jacobus Marinus Sturm, Věra Hájková, Kai Tiedtke, Hartmut Enkisch, Karel Saksl, Sven Toleikis, Vladimir Lipp, Marek Jurek, Libor Juha

Publikováno v: Optics express 26(15), 19665-19685 (2018). doi:10.1364/OE.26.019665
Optics express, 26(15), 19665-19685. The Optical Society
Milov, I.; Makhotkin, I.A.; Sobierajski, R.; Medvedev, N.; Lipp, V.; Chalupský, J.; Sturm, J.M.; Tiedtke, K.; de Vries, G.; Störmer, M.; Siewert, F.; van de Kruijs, R.; Louis, E.; Jacyna, I.; Jurek, M.; Juha, L.; Hájková, V.; Vozda, V.; Burian, T.; Saksl, K.; Faatz, B.; Keitel, B.; Plönjes, E.; Schreiber, S.; Toleikis, S.; Loch, R.; Hermann, M.; Strobel, S.; Nienhuys, H.-K.; Gwalt, G.; Mey, T.; Enkisch, H.; Bijkerk, F.: Mechanism of single-shot damage of Ru thin films irradiated by femtosecond extreme UV free-electron laser. In: Optics express. Vol. 26 (2018) 15, 19665-19685. (DOI: /10.1364/OE.26.019665)

Optics express 26(15), 19665 - 19685 (2018). doi:10.1364/OE.26.019665
Ruthenium is a perspective material to be used for XUV mirrors at free-electron laser facilities. Yet, it is still poorly studied in the context of ultrafast laser-matter inte

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::44c9434c6e13568444356468d4132f4e

Experimental study of EUV mirror radiation damage resistance under long-term free-electron laser exposures below the single-shot damage threshold.

Autor: Makhotkin, Igor A.¹ i.makhotkin@utwente.nl, Sobierajski, Ryszard², Chalupský, Jaromir³, Tiedtke, Kai⁴, de Vries, Gosse⁵, Störmer, Michael⁶, Scholze, Frank⁷, Siewert, Frank⁸, van de Kruijs, Robbert W. E.¹, Milov, Igor¹, Louis, Eric¹, Jacyna, Iwanna², Jurek, Marek², Klinger, Dorota², Nittler, Laurent², Syryanyy, Yevgen², Juha, Libor^3,9, Hájková, Věra³, Vozda, Vojtěch^3,10, Burian, Tomáš^3,9

Publikováno v: Journal of Synchrotron Radiation. Jan2018, Vol. 25 Issue 1, p77-84. 8p.