Zobrazeno 1 - 1
of 1
pro vyhledávání: '"Ivanskiy V. B."'
Publikováno v:
Tekhnologiya i Konstruirovanie v Elektronnoi Apparature, Iss 3, Pp 44-49 (2011)
Expressions for calculating the measurement errors of X-ray devices features are given as follows: mean photon energy, homogeneity coefficient, the first and the second half-value layer (1st HVL, 2nd HVL). Comparison of errors is organized at measure
Externí odkaz:
https://doaj.org/article/eb18dab746624330925a43260dd8228c
