Zobrazeno 1 - 7
of 7
pro vyhledávání: '"Ivan Yu. Protsenko"'
Autor:
Oksana Kalinkevich, Ivan Yu. Protsenko, S. N. Danilchenko, Sergey Kolinko, Hlib Polozhii, Yevgen Zinchenko, Aleksandr G. Ponomarev, Aleksei Kalinkevich
Publikováno v:
2020 IEEE 10th International Conference Nanomaterials: Applications & Properties (NAP).
Proton-beam writing is a high-resolution lithographic technology that can be used to fabricate 3D micro- and nanostructures for various applications. In particular, the method is suitable for creating 3D matrices for cell growth and development. Howe
Publikováno v:
Nanooptics, Nanophotonics, Nanostructures, and Their Applications ISBN: 9783319910826
The results of the study of phase composition and electrophysical (resistivity, thermal coefficient of resistance, strain effect) and magnetoresistivity properties (anisotropic magnetoresistance) of thin films (up to 60 nm) of high-entropy alloys bas
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b6b12ae421e08751524c483eef3b33de
https://doi.org/10.1007/978-3-319-91083-3_2
https://doi.org/10.1007/978-3-319-91083-3_2
Autor:
D. V. Velykodnyi, Ivan Yu. Protsenko, Larysa Valentynivna Odnodvorets, S. I. Protsenko, O. V. Synashenko
Publikováno v:
Crystal Research and Technology. 44:74-81
Results of experimental researches of electrophysical properties of Multilayer film systems Ni/V, and Cr/Fe which was formed on the basis of nanocrystals (V, Cr and Fe) and high dispersed Ni films are presented. It is carried out comparisons of exper
Publikováno v:
Surface Science. 601:4454-4458
The effect on the interface structure of multilayers of a pre-deposited ultrathin film of Bi and Pb surfactants introduced into Co/Cu multilayers has been studied. The [Co(1 nm)/Cu(2 nm)] multilayers were thermally evaporated at very low deposition r
Publikováno v:
Springer Proceedings in Physics ISBN: 9783319066103
This chapter is devoted to the strain properties of multilayer thin-film materials based on metals. Although this problem is the subject of study researchers, many questions remain poorly understood, which include the development of a theoretical mod
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fc2e8bac63a7b87ab3ae1c13f91f5755
https://doi.org/10.1007/978-3-319-06611-0_28
https://doi.org/10.1007/978-3-319-06611-0_28
Publikováno v:
Crystal Research and Technology. 35:329-332
The microscopic theory for the coefficient of longitudinal tensosensibility of multi-layer polycrystalline metal films has been developed. The theory takes into consideration as the scattering of conductivity electrons on external and internal surfac
Publikováno v:
Japanese Journal of Applied Physics. 39:L1320
A three-dimensional model of strain sensitivity proposed by [Tellier, Tosser: Thin Solid Films 59 (1979) 163; Tosser, Tellier and Pichard: J. Mater. Sci. 16 (1981) 944] has been tested for thin Cr, Cu and Co films. The films were obtained by electron