Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Ivan I. Shvetsov-Shilovskiy"'
Autor:
Andrey G. Petrov, Ivan I. Shvetsov-Shilovskiy, Sergey B. Shmakov, Anastasia V. Ulanova, Anna B. Boruzdina
Publikováno v:
Безопасность информационных технологий, Vol 29, Iss 2, Pp 100-111 (2022)
The aim of the study is to consider the prospects of using resistive memory microcircuits (RRAM, CBRAM) for space applications. Total dose and single event effects in resistive memory test cells and finished CMOS RRAM microcircuits were investigated.
Externí odkaz:
https://doaj.org/article/fd8fbafe5cf54f69b67c6260e0801268
Publikováno v:
Безопасность информационных технологий, Vol 27, Iss 3, Pp 43-53 (2020)
The paper presents the developed algorithm for correlating the physical and logical addressing in memory chips using laser radiation sources to determine the nature of failures in radiation tests. A variant of the hardware-software implementation of
Externí odkaz:
https://doaj.org/article/66d0baed318e400aa6d6000a89f90e14
Publikováno v:
Безопасность информационных технологий, Vol 27, Iss 3, Pp 66-75 (2020)
This study offers an adapted method for monitoring functional failures in NOR flash memory during tests for resistance to heavy charged particles. The experiment was conducted on the basis of the "U-400" cyclotron. Experimental results of approbation
Externí odkaz:
https://doaj.org/article/3cadf926845e436881fafa5c934ea0b0
Autor:
Ivan I. Shvetsov-Shilovskiy
Publikováno v:
2021 International Siberian Conference on Control and Communications (SIBCON).
This paper is dedicated to the features of the software component of the memory test setup based on the object-oriented approach in LabVIEW environment. The specificities of the software development for test setups used for the control of the electro
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::91ef5d7466accfe8baba28e0f36eaecf
https://doi.org/10.1109/sibcon50419.2021.9438930
https://doi.org/10.1109/sibcon50419.2021.9438930