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pro vyhledávání: '"Isolde E. Reis"'
Autor:
Jonas Haunschild, Teodora Chipei, Michael Linse, Isolde E. Reis, Matthias Demant, Benjamin Thaidigsmann, Stefan Rein
Publikováno v:
Solar Energy Materials and Solar Cells. 106:71-75
Photoluminescence (PL) imaging is a promising characterization technique for rating and sorting of multicrystalline silicon (mc-Si) as-cut wafers concerning to their material quality. It is inline applicable and yields high resolution images showing
Publikováno v:
physica status solidi (RRL) - Rapid Research Letters. 5:199-201
Only recently, methods for quality control of multicrystalline silicon wafers have been published, which allow the efficiency of solar cells to be predicted precisely from photoluminescence (PL) images taken in the as-cut state. In this letter it is