Výsledky vyhledávání - "Isolde E. Reis"

Rating and sorting of mc-Si as-cut wafers in solar cell production using PL imaging

Autor: Jonas Haunschild, Teodora Chipei, Michael Linse, Isolde E. Reis, Matthias Demant, Benjamin Thaidigsmann, Stefan Rein

Publikováno v: Solar Energy Materials and Solar Cells. 106:71-75

Photoluminescence (PL) imaging is a promising characterization technique for rating and sorting of multicrystalline silicon (mc-Si) as-cut wafers concerning to their material quality. It is inline applicable and yields high resolution images showing

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::96a43c19514fb27b600d51a2bfdeaa43
https://doi.org/10.1016/j.solmat.2012.05.027

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Detecting efficiency-limiting defects in Czochralski-grown silicon wafers in solar cell production using photoluminescence imaging

Autor: Jonas Haunschild, Isolde E. Reis, Juliane Geilker, Stefan Rein

Publikováno v: physica status solidi (RRL) - Rapid Research Letters. 5:199-201

Only recently, methods for quality control of multicrystalline silicon wafers have been published, which allow the efficiency of solar cells to be predicted precisely from photoluminescence (PL) images taken in the as-cut state. In this letter it is

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::5bec474893523a473cd68e0d759fa158
https://doi.org/10.1002/pssr.201105183

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Akademický článek

Detecting efficiency-limiting defects in Czochralski-grown silicon wafers in solar cell production using photoluminescence imaging.

Autor: Haunschild, Jonas, Reis, Isolde E., Geilker, Juliane, Rein, Stefan

Publikováno v: Physica Status Solidi - Rapid Research Letters; Jun2011, Vol. 5 Issue 5/6, p199-201, 3p

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